Piezoelectric Mirror Detection Circuit for Sharp Scan Speed Changes
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Solution Overview
Problem
Existing detection circuits using integrators struggle to generate high-quality detection signals when the scanning speed of light deflecting elements changes sharply, as they cannot follow the speed changes accurately, leading to inaccurate detection signals.
Innovation Solution
A detection circuit that uses a field effect transistor to generate a detection signal by inputting the voltage generated in a monitoring piezoelectric element to the gate of a field effect transistor, allowing for a wide input range and high followability to the input voltage, thereby generating a detection signal that accurately follows the change in scanning speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an integrator is used in the detection circuit, then the detection signal can be generated from the piezoelectric element current, but the detection signal cannot accurately follow sharp changes in scanning speed
Solution Approach 1:
The patent extracts and removes the integrator circuit from the detection circuit design. By taking out the integrator, the patent eliminates the component that causes delay in following sharp speed changes, while retaining the piezoelectric element current signal processing to generate the detection signal directly without integration, thereby enabling accurate response to sharp scanning speed changes.
Solution Approach 2:
Instead of integrating the piezoelectric element current signal as in conventional designs, the patent inverts the approach by using the current signal directly or with minimal processing. This inversion of the signal processing sequence (from integration to direct usage) allows the detection circuit to respond immediately to sharp changes in scanning speed without the delay inherent in integrator-based systems.
2Productivity
If the scanning speed changes sharply, then the light deflecting element can quickly adjust position, but the integrator-based detection circuit cannot follow the change accurately
Solution Approach 1:
The patent removes the integrator from the detection circuit, eliminating the source of delay that prevents accurate tracking of sharp scanning speed changes. This extraction allows the detection circuit to maintain high measurement precision even when the scanning speed changes rapidly, as the circuit no longer introduces temporal smoothing or delay.
Solution Approach 2:
The patent changes the processing parameters of the detection circuit by switching from an integrator-based approach to a direct signal processing approach. This parameter change in the circuit configuration allows the detection signal to accurately reflect sharp changes in scanning speed, enabling both high productivity and high measurement precision simultaneously.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The detection circuit accurately generates a detection signal that follows the change in scanning speed, enabling precise control of the light deflecting element's operation state and scanning position, even when the scanning speed changes sharply.
Implementation Method 1
a voltage generated in a monitoring piezoelectric element for monitoring an operation state of a light deflecting element
Data Source
AI summary
Provided are a detection circuit and an image generation device capable of accurately generating a detection signal corresponding to a change in a scanning speed. Mirror detection circuit (detection circuit) inputs a voltage generated in a monitoring piezoelectric element for monitoring an operation state of a second scanning part (light deflecting element) to a gate of field effect transistor constituting a source follower circuit, and generates a detection signal corresponding to expansion or contraction of the piezoelectric element from a source voltage of field effect transistor.