Pillar-Shaped Semiconductor Memory Device for High-Density SRAM

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Solution Overview

Problem

There is a need for increased density and performance in SRAM cell circuits, particularly in semiconductor memory devices, as existing technologies struggle to achieve high-density and high-speed configurations using surrounding gate MOS transistors (SGTs).

Innovation Solution

A pillar-shaped semiconductor memory device is designed with multiple semiconductor pillars and a specific configuration of impurity regions, gate insulating layers, and gate conductor layers, along with interlayer insulating layers and wiring conductor layers, to form a high-density SRAM cell circuit. This configuration includes multiple SGTs connected through a limited number of contact holes, allowing for efficient integration and performance enhancement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If multiple SGTs are integrated in separate semiconductor pillars to increase density, then the integration density improves, but the number of contact holes and wiring layers increases, leading to increased device complexity

Engineering Contradiction:
Improveintegration densityVSAvoiddevice complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

Multiple SGTs that would traditionally require separate contact holes and wiring connections are merged into a single shared contact hole structure. The gate electrode extends continuously across multiple semiconductor pillars, allowing multiple transistors to share common electrical connections, thereby reducing the number of contact holes and wiring layers while maintaining high integration density

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

A single contact hole serves multiple functions by providing electrical connection to multiple SGTs simultaneously. The gate electrode structure performs multiple functions by acting as both the gate for individual SGTs and as an interconnect element that replaces traditional wiring layers, reducing overall device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Quantity of substance

If the SRAM cell circuit area is reduced to increase density, then integration density improves, but the performance and speed of the circuit may deteriorate

Engineering Contradiction:
Improveintegration densityVSAvoidcircuit performance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent transitions from planar two-dimensional layout to three-dimensional vertical architecture. SGTs are formed in vertically extending semiconductor pillars with gate electrodes surrounding the channels in three dimensions. This vertical stacking allows multiple transistors to be packed into a smaller planar area while maintaining adequate channel lengths and gate control, thus preserving circuit performance while achieving higher density

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS10658371B2Method for producing a pillar-shaped semiconductor memory device
Publication Date: 2020.05.19 UNISANTIS ELECTRONICS SINGAPORE PTE LTD
  • US10658371B2 patent drawing
  • US10658371B2 patent drawing
  • US10658371B2 patent drawing

AI summary

A method for producing a pillar-shaped semiconductor device includes, forming a first semiconductor pillar, a second semiconductor pillar, and a third semiconductor pillar on a substrate. A gate insulating layer and gate conductor layer are formed surrounding each of the pillars and impurity regions are formed in each pillar. The gate conductor layer is selectively processed to form gate conductors around the pillars and to interconnect the gate conductors.