Pin Driver Calibration via Bypass Circuitry

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Solution Overview

Problem

Existing automated test systems face challenges in providing a compact, low-power, high-fidelity solution for testing electronic devices with minimal loading effects on the device under test, while accommodating diverse test requirements and allowing for user calibration across multiple channels.

Innovation Solution

A partitioned force-sense system utilizing integrated switches and dual-purpose signal paths across different semiconductor substrates and manufacturing processes, enabling selective auxiliary control and calibration, with a per-pin parametric measurement unit (PMU) and driver/comparator circuits optimized for high precision and high bandwidth operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If traditional automated test systems are used, then comprehensive test functionality is provided, but system size and power consumption increase

Engineering Contradiction:

Improvetest functionalityVSAvoidpower consumption

Core Design Contradiction:

Adaptability or versatilityVSUse of energy by stationary object

Solution Approach 1:

The test system is divided into separate functional modules: a parametric measurement unit (PMU) for precision measurements and a driver/comparator circuit for signal generation and detection. These modules can be independently configured and powered, allowing the system to consume power only when specific test functions are active, thereby reducing overall power consumption while maintaining comprehensive test capability.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The driver circuit is designed to perform multiple functions: it acts as a voltage source for stimulating the DUT, a current source for biasing, and a termination resistor for signal integrity. The comparator circuit similarly serves both as a measurement instrument and as a stimulus generator. This multi-functionality reduces the number of separate components needed, thereby reducing power consumption while maintaining versatile test functionality.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Area of stationary object

If integrated device structures are used, then die area is minimized, but loading effects at DUT interface increase

Engineering Contradiction:

Improvedie areaVSAvoidloading effects

Core Design Contradiction:

Area of stationary objectVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an external resistor connected to the DUT interface that serves as an intermediary element. This external resistor works in conjunction with the integrated device structures to provide the necessary termination and biasing functions without requiring large on-chip resistors, thereby minimizing die area while controlling loading effects through the external component.

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The system allows dynamic adjustment of test parameters including voltage levels, current levels, and termination resistance values. By changing these parameters adaptively based on the specific test requirements and DUT characteristics, the system can minimize loading effects for different test scenarios while maintaining compact integrated structures.

Inventive Principle:

Principle #35Parameter changes

3Adaptability or versatility

If multiple driver circuits with different amplitude and timing characteristics are provided, then diverse test requirements are met, but device complexity increases

Engineering Contradiction:

Improvetest signal characteristicsVSAvoidcircuit configuration

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The driver circuit incorporates dynamically controllable parameters including adjustable voltage amplitude, current amplitude, and timing characteristics through control signals. This dynamic configurability allows a single driver circuit to replace multiple fixed-function circuits, providing diverse test signal characteristics while reducing overall device complexity through parameter adjustment rather than structural multiplication.

Inventive Principle:

Principle #15Dynamics

4Ease of operation

If external switches are used for channel access, then calibration capability is provided, but switch resistance and loading on DUT pin increase

Engineering Contradiction:

Improvecalibration accessVSAvoidswitch loading

Core Design Contradiction:

Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent provides multiple independent calibration access points that replicate the full DUT interface functionality. Each channel has its own dedicated calibration access that copies the complete signal path characteristics, allowing calibration without introducing external switches that would add resistance and loading. This copying approach enables direct calibration access while maintaining signal integrity.

Inventive Principle:

Principle #26Copying

Data Source

PatentUS11313903B2Pin driver and test equipment calibration

Publication Date: 2022.04.26 ANALOG DEVICES INC

AI summary

A force-sense system can provide signals to, or receive signals from, a device under test (DUT) at a first DUT node. The system can include output buffer circuitry configured to provide a DUT signal to the DUT in response to a force control signal at a buffer control node, and controller circuitry configured to provide the force control signal at the buffer control node. The system can include bypass circuitry configured to selectively bypass the controller circuitry and provide an auxiliary control signal at the buffer control node. The auxiliary control signal can be used for system calibration. In an example, an external calibration circuit can provide the auxiliary control signal in response to information received from the DUT.