Pin Function Mapping for Reusable Test Pattern Generation
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Solution Overview
Problem
Existing test equipment systems face inefficiencies in pin function mapping due to the need for explicit coding of source signals at each test cycle, limiting program reusability and portability.
Innovation Solution
A pattern generation system with a pin function mapper that uses a lookup table indexed by a pin function index to dynamically map source signals to test channels, allowing flexible and efficient pin function configuration through a pin-mapping operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If explicit coding of source signals is used at each test cycle, then the test equipment can perform test activities, but program reusability and portability are limited
Solution Approach 1:
The pin function mapper is designed to handle multiple pin function mappings through a unified lookup table structure. The system uses a generic pin-mapping operation that can accommodate different test cycles and test activities by simply changing the pin function index, making the same hardware structure universally applicable to various testing scenarios without requiring explicit coding for each case.
Solution Approach 2:
The system changes the parameter being mapped from explicit source signal coding to pin function index values. By storing mappings in a lookup table indexed by pin function index rather than hardcoding source signals in test routines, the system transforms the parameter representation, enabling more flexible and reusable test programs while reducing coding complexity.
2Productivity
If pin function mapping is integrated into specific test routines, then source signals can be assigned, but program development efficiency is reduced
Solution Approach 1:
The pin function mapping functionality is extracted from specific test routines and consolidated into a dedicated pin function mapper module. This separation allows test programs to focus on test logic while the mapper handles source signal assignment automatically through the pin-mapping operation, improving both development efficiency and program portability.
Solution Approach 2:
The pin function mapper acts as an intermediary between the test routines and the source signal assignment. Instead of directly coding source signals in test routines, the system uses the pin function mapper as a mediator that translates pin function indices into appropriate source signal selections through the lookup table, simplifying test program development and improving portability.
3Adaptability or versatility
If dynamic pin function mapping is implemented, then adaptability to different test environments is improved, but system complexity increases
Solution Approach 1:
The system performs preliminary action by pre-storing all pin function mappings in a lookup table before test execution. The mapping relationships between pin function indices and source signals are established in advance, allowing the pin function mapper to quickly retrieve appropriate mappings during test cycles without complex real-time decision logic, thus improving adaptability while keeping the system relatively simple.
Data Source
AI summary
In certain aspects, a pattern generation system includes a memory and a processor coupled to the memory. The memory is configured to store a lookup table set. The lookup table set includes a mapping relationship between source patterns and a set of test channels, and is indexed based on a pin function index. The processor is configured to generate the source patterns, execute a pin-mapping operation based on an instruction to obtain a set of source selection signals for the set of test channels based on the pin function index and the lookup table set, and select and output a source signal from the source patterns for each test channel based on a corresponding source selection signal for the respective test channel.