p-i-n Photodetector Electrode Layout for Low Dark Current

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Solution Overview

Problem

Existing semiconductor photo-detecting devices face challenges in optimizing the structure and materials to enhance photocurrent generation while minimizing dark current and improving signal-to-noise ratio, particularly in p-i-n structures.

Innovation Solution

A semiconductor photo-detecting device with a p-i-n structure is designed, featuring a first semiconductor layer, a second semiconductor layer with distinct conductivity-type regions, a light-absorbing layer, and an electrode structure, where the electrode structure is strategically positioned to minimize current leakage and maximize light absorption, utilizing a diffusion barrier layer to control dopant diffusion, and an anti-reflection layer to enhance light detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the photo-detecting device uses a conventional structure without optimized electrode positioning, then the device complexity is low, but the signal-to-noise ratio is poor due to current leakage and insufficient light absorption

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by creating distinct conductivity-type regions (first and second regions with different conductivity types) within the second semiconductor layer. This local differentiation optimizes charge carrier separation and collection at specific locations, improving photocurrent generation and signal-to-noise ratio without requiring complete structural redesign throughout the entire device

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent positions the electrode structure on the insulating layer rather than directly on the semiconductor layer, adding a vertical dimension to the electrode placement. This dimensional change allows the electrode to collect carriers more effectively while minimizing current leakage paths, thereby improving signal-to-noise ratio without significantly increasing overall device complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If the device uses a simple semiconductor layer structure, then the manufacturing process is simple, but photocurrent generation is insufficient

Engineering Contradiction:
Improvephotocurrent generationVSAvoidlayer structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent segments the second semiconductor layer into distinct first and second regions with different conductivity types. This segmentation creates optimized pathways for charge carrier separation and collection, significantly enhancing photocurrent generation. The segmented structure achieves high productivity by dividing the semiconductor layer into functionally specialized zones rather than using a uniform simple structure

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs composite material principles by combining semiconductor layers with different conductivity types (n-type and p-type regions) within the same device structure. This composite approach creates synergistic effects that enhance light absorption and charge carrier generation, achieving superior photocurrent generation compared to simple single-type semiconductor structures

Inventive Principle:
Principle #40Composite materials

3Reliability

If the device uses conventional material arrangement, then the manufacturing process is straightforward, but dark current is high

Engineering Contradiction:
Improvedark current reductionVSAvoidmanufacturing complexity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent introduces an insulating layer as an intermediary between the semiconductor layers and the electrode structure. This intermediary layer acts as a barrier that blocks current leakage paths while allowing effective charge collection, significantly reducing dark current. The insulating layer serves as a mediating element that reconciles the need for effective carrier collection with the need to minimize leakage currents

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies local quality by creating specific doped regions with different conductivity types in strategic locations within the semiconductor structure. These localized regions with optimized electrical properties create internal fields that suppress carrier leakage and reduce dark current, achieving low dark current operation without requiring complete restructuring of the entire device

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The device achieves improved photocurrent generation with reduced dark current and enhanced signal-to-noise ratio, facilitating applications in various fields including lighting control, medical care, and communication systems.

Implementation Method 1

a light-absorbing layer located between the first semiconductor layer and the second semiconductor layer

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

an anti-reflection layer to enhance light detection

Methodology Applied
Scientific EffectAnti-reflection: Anti-Reflective Coating

Implementation Method 3

utilizing a diffusion barrier layer to control dopant diffusion

Methodology Applied
Scientific EffectDiffusion barrier: Diffusion Barrier

Data Source

PatentUS12514027B2Semiconductor photo-detecting device
Publication Date: 2025.12.30 EPISTAR CORP
  • US12514027B2 patent drawing
  • US12514027B2 patent drawing
  • US12514027B2 patent drawing

AI summary

A photo-detecting device includes a first semiconductor layer, a second semiconductor layer located on the first semiconductor layer, a light-absorbing layer located between the first semiconductor layer and the second semiconductor layer, an insulating layer located on the second semiconductor layer, and an electrode structure located on the insulating layer. The second semiconductor layer includes a first region having a first conductivity-type and a second region having a second conductivity-type different from the first conductivity-type. The first region is surrounded by the second region, and includes a geometric center and an interface between the first region and the second region. The insulating layer covers the first region and the second region. The electrode structure includes an outer sidewall located on the second region. In a top view, the interface is located between the geometric center and the outer sidewall.