Pin State Configuration Circuit Using Voltage Ratios for More IC Modes
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing pin state configuration methods for integrated circuit (IC) chips face challenges in efficiently configuring multiple states due to power losses and low precision in resistor-based voltage division methods, especially when configuring multiple pins.
Innovation Solution
A pin state configuration circuit comprising a configured resistor load, a voltage sampling unit, and a comparator that calculates voltage ratios from multiple configuration pins to determine pin states, allowing for N×N configuration states without continuous power loss by using a π-type resistor topology and optional capacitors for additional state combinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If resistor voltage division method is used for pin state configuration, then different voltages can represent different pin states, but continuous power loss occurs after configuration
Solution Approach 1:
The patent uses periodic action by implementing configuration only during the IC mode detection phase at startup. The voltage sampling unit samples configuration pin voltages only during this periodic detection phase, not continuously. After configuration is complete, the resistors stop consuming power, thus converting continuous power loss into periodic action that occurs only when needed.
2Adaptability or versatility
If two pins are used for configuration with resistor voltage division, then different modes can be configured, but the number of configurable states is limited
Solution Approach 1:
The patent merges the functions of multiple configuration pins into a unified detection mechanism. The voltage sampling unit samples voltages from multiple configuration pins simultaneously, and the comparator processes all these voltage signals together to determine the configuration state. This merging approach allows N×N states to be configured using the combined information from multiple pins without requiring separate detection circuits for each pin.
Solution Approach 2:
The patent transitions from one-dimensional voltage comparison to two-dimensional voltage ratio analysis. Instead of comparing absolute voltage values on a single pin, the system calculates voltage ratios between multiple configuration pins, adding a dimensional aspect to the configuration detection. This dimensional change enables significantly more configurable states (N×N) from the same number of physical pins.
3Adaptability or versatility
If internal and external resistors are used for comparison, then a single pin can configure multiple states, but comparison precision is low due to different resistor characteristics
Solution Approach 1:
The patent changes the detection parameter from absolute voltage values to voltage ratios. The comparator calculates the ratio of voltages sampled from different configuration pins, which eliminates the impact of resistor characteristic variations. This parameter change from voltage magnitude to voltage ratio enables high-precision configuration detection even when using resistors with different characteristics.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the precision of state configuration and increases the number of configurable states while eliminating power loss after configuration, improving the efficiency and functionality of IC chips.
Implementation Method 1
the configuration circuit implements mode configuration based on a resistor voltage division policy. A voltage of a mode configuration pin MOD between VCC and GND is configured through voltage division by using resistors R01 and R02.
Implementation Method 2
The comparator may calculate a first voltage ratio based on the voltage of the first configuration pin and the voltage of the second configuration pin that are sampled by the voltage sampling unit
Data Source
AI summary
A pin state configuration circuit, a method for configuring pin states and an electronic device for configuring pin states are provided. The pin state configuration circuit includes a configured resistor load, a voltage sampling unit, and a comparator. The voltage sampling unit supplies a reference voltage to the configured resistor load by using a first or second configuration pin, and respectively samples voltages of the first and second configuration pins. The comparator calculates a first voltage ratio based on the voltage of the first configuration pin and the voltage of the second configuration pin, calculates a second voltage ratio based on the voltage of the first configuration pin and the voltage of the second configuration pin, and determines a corresponding pin configuration state based on the first and second voltage ratios. In this way, N×N pin configuration states may be obtained by configuring two configuration pins.


