Tin-Plated Pin Terminal Structure for Low-Force Connector Insertion
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Solution Overview
Problem
Pin terminals with existing post-plating methods suffer from increased insertion force due to localized thickening of plating layers, reducing insertability and requiring additional Pd plating, which complicates manufacturability and increases the risk of short circuits from whiskers.
Innovation Solution
A pin terminal design featuring a multistage plating method with a tin-based layer having a thin film and thick film portion, where the thin film is in contact with the base material and has a controlled thickness, reducing whisker formation and eliminating the need for Pd plating, and a heat treatment process to prevent melting and whisker growth.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a post-plating method is used to ensure solder wettability, then solder wettability is improved, but localized thickening of the plating layer occurs, increasing insertion force and reducing insertability
Solution Approach 1:
The plating layer is segmented into multiple layers with different functions: a first plating layer (Sn-Pd alloy) that prevents whisker formation and provides baseline solder wettability, and a second plating layer (pure Sn or Sn-based) that enhances solder wettability. This segmentation allows each layer to perform its specific function without causing localized thickening that would increase insertion force.
Solution Approach 2:
The patent applies different plating compositions and thicknesses at different locations and depths. The first plating layer has a specific Pd content (0.01-5 mass%) distributed throughout, while the second plating layer is applied only on the outer surface where solder contact occurs. This local differentiation ensures solder wettability is enhanced where needed without creating excessive thickness that would impede insertion.
2Reliability
If Pd plating is added to prevent whisker formation, then reliability against short circuits is improved, but manufacturing complexity increases
Solution Approach 1:
The patent creates a composite plating structure where a Sn-Pd alloy layer (first plating layer) is combined with a pure Sn or Sn-based layer (second plating layer). The Sn-Pd alloy provides whisker resistance while the outer Sn layer provides solder wettability. This composite structure achieves both reliability functions in a single integrated plating system that can be manufactured using standard electroplating processes.
Solution Approach 2:
The patent extracts the whisker prevention function into a dedicated first plating layer with controlled Pd content, while the second plating layer focuses solely on providing solder wettability. This functional extraction allows each layer to be optimized independently and simplifies the manufacturing process by using sequential electroplating steps rather than requiring complex multi-material assembly.
3Reliability
If plating thickness is increased to improve solder wettability, then solder wettability is improved, but insertion force increases due to localized thickening
Solution Approach 1:
The patent creates a dynamic plating structure where the second plating layer is applied selectively on the outer surface of the first plating layer. This dynamic application ensures that the enhanced solder wettability is achieved only where solder contact occurs, while the overall plating thickness remains controlled to prevent excessive insertion force. The structure adapts the thickness distribution to match the functional requirements of different regions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances solder wettability and insertability while reducing the formation of whiskers, preventing short circuits and improving manufacturability by maintaining a uniform plating thickness and preventing localized thickening, thus reducing insertion force and ensuring reliable connections.
Implementation Method 1
a heat treatment process to prevent melting and whisker growth
Implementation Method 2
a maximum wetting force of the tip covering portion measured by a meniscograph tester is 0.25 mN or more
Data Source
AI summary
A pin terminal includes a bar-like base material and a plating layer covering a predetermined region of the base material. A constituent material of the base material is pure copper or a copper alloy. The plating layer includes a tin-based layer made of metal containing tin. One end side of the base material includes a tip covering portion covering an entire region in a circumferential direction of the base material. The tin-based layer includes the tip covering portion. The tip covering portion includes a thin film portion and a thick film portion at positions different in the circumferential direction of the base material. The thin film portion is provided in contact with the base material. The number of whiskers present on a surface of the thin film portion is 15 or less in a square visual field having one side length of 0.35 mm.


