Pixel Buffer Selection for Signal Inspection

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Solution Overview

Problem

Existing solid-state imaging devices have limitations in signal inspection due to only a part of the pixel output lines being connected to a buffer, leading to insufficient voltage potential output and inadequate failure analysis.

Innovation Solution

An electronic device with a cell array unit and signal lines connected to cells, featuring a selection mechanism that allows for the output of voltage potential signals from selected signal lines, enabling more comprehensive signal input and output, and facilitating failure inspection with higher accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If only a part of pixel output lines is connected to the buffer, then the device complexity is reduced, but the measurement precision and inspection accuracy deteriorate

Engineering Contradiction:
Improvebuffer connection configurationVSAvoidvoltage potential output accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The buffer is designed to handle multiple signal lines through a selection mechanism controlled by selection signals. This allows a single buffer to serve multiple pixel output lines by dynamically connecting to different lines based on the inspection requirements, achieving both reduced complexity and maintained measurement precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The connection between the buffer and pixel output lines is made dynamic through selection signals that can switch which line is connected to the buffer. This dynamic reconfigurability allows the system to inspect different lines sequentially, providing comprehensive inspection coverage without requiring permanent connections to all lines simultaneously.

Inventive Principle:
Principle #15Dynamics

2Device complexity

If only a part of pixel output lines is connected to the buffer, then the device complexity is reduced, but the reliability of failure analysis deteriorates

Engineering Contradiction:
Improvebuffer connection configurationVSAvoidfailure analysis reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The dynamic selection mechanism allows the inspection system to systematically examine different pixel output lines by changing connections based on selection signals. This ensures that failure analysis can be performed on any line as needed, maintaining high reliability without requiring all lines to be permanently connected to the buffer.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The selection mechanism is designed to enable systematic inspection of different lines in a controlled sequence. By preparing the selection signals and connection switching capability in advance, the system can reliably identify failures in any pixel output line through methodical inspection, even though only one line is connected to the buffer at any given time.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If voltage potential signals from multiple signal lines are made accessible, then the measurement precision and inspection accuracy are improved, but the device complexity increases

Engineering Contradiction:
Improvevoltage potential output accuracyVSAvoidsignal line connection structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A single buffer unit is designed to handle multiple pixel output lines by incorporating a selection mechanism. This multi-functional buffer can connect to and inspect any of the multiple signal lines as needed, providing comprehensive measurement capability without requiring separate buffers for each line, thus avoiding proportional increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system uses dynamic connection switching controlled by selection signals to make different signal lines accessible to the buffer at different times. This temporal multiplexing approach allows multiple lines to be inspected using a single buffer, achieving high measurement precision across all lines without the complexity of permanent multi-line connections.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS11743448B2Electronic device, system, and method of controlling electronic device
Publication Date: 2023.08.29 CANON KK
  • US11743448B2 patent drawing
  • US11743448B2 patent drawing
  • US11743448B2 patent drawing

AI summary

Provided is an electronic device including a cell array unit in which cells are arranged in rows and columns, signal lines, each of the signal lines being arranged corresponding to one of the rows or columns and being connected to corresponding cells, a first electrode via which a signal according to a signal transmitted via at least one of the signal lines passes, a second electrode to which a selection signal is input to select a part of the signal lines; and a third electrode that is electrically connected to a node between cells that are connected to the part of the signal lines selected based on the selection signal and the first electrode. A voltage potential of the third electrode correlates with a voltage potential of the part of the signal lines selected based on the selection signal.