Pixel-Diversity IRIS Sensor for Single-Frame Nanoparticle Detection
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Solution Overview
Problem
Existing single-particle interferometric reflectance imaging sensors (SP-IRIS) require multiple image acquisitions at different focal positions (z-stacks) due to z-scan measurements, which are time-consuming and computationally intensive, limiting their practical application for nanoparticle detection.
Innovation Solution
The pixel-diversity IRIS (PD-IRIS) method encodes optical signatures of nanoparticles within a single image frame using cameras with filters or pixels sensitive to multiple light components, eliminating the need for z-stack acquisitions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If z-scan measurements with multiple frames at different focal positions are used, then sensitivity for nanoparticle detection is improved, but acquisition time and computational processing power requirements increase
Solution Approach 1:
The patent introduces pixel diversity as a new dimension for encoding optical information. Instead of acquiring multiple frames at different focal positions (z-dimension), the system uses pixels with different sensitivity profiles (pixel-dimension) to capture optical signatures in a single frame. This dimensional shift from temporal/multi-planar acquisition to spatial/pixel-variability acquisition resolves the contradiction between sensitivity and acquisition time.
Solution Approach 2:
The patent changes the parameter of pixel sensitivity by incorporating pixels with diverse sensitivity profiles in the imaging sensor. This parameter change allows the system to extract optical signature information that would traditionally require multiple focal plane measurements, thereby maintaining sensitivity while reducing acquisition time to a single frame capture.
2Measurement precision
If z-scan measurements with multiple frames at different focal positions are used, then sensitivity for nanoparticle detection is improved, but computational processing power requirements increase
Solution Approach 1:
By shifting from z-scan measurements (requiring processing of multiple focal plane images) to pixel-diversity imaging (using spatial variations across pixels with different sensitivity profiles), the patent reduces the dimensionality of data that requires computational processing. The optical signature is extracted directly from spatial patterns in a single frame rather than requiring complex analysis of image stacks.
Solution Approach 2:
The patent extracts the essential optical signature information directly from the spatial distribution of signal intensities across pixels with diverse sensitivity profiles. This extraction method eliminates the need for computationally intensive processing of multiple focal plane images, as the signature is embedded in the single-frame pixel diversity pattern.
3Measurement precision
If z-scan measurements are used, then optical signature extraction is achieved, but device complexity increases due to additional optical components
Solution Approach 1:
The patent extracts optical signature information directly from the native pixel diversity of the imaging sensor without requiring additional optical components for z-scan measurements. The system utilizes the inherent variations in pixel sensitivity profiles to encode and retrieve optical signatures, eliminating the need for complex optical scanning mechanisms.
Solution Approach 2:
The imaging sensor's pixel array serves dual purposes: both capturing the image and providing the diversity needed for optical signature extraction. The pixels themselves, with their naturally diverse sensitivity profiles, perform the function of encoding optical information, eliminating the need for separate optical components or mechanisms to achieve signature extraction.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
PD-IRIS reduces data acquisition and processing time by compressing data dimensionality, enabling faster and more efficient nanoparticle detection without the need for z-stack measurements.
Implementation Method 1
generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate
Implementation Method 2
each nanoparticle on the target substrate producing reflected light with different characteristics for each one of the plurality of light components of the illumination light
Data Source
AI summary
Aspects of inventive concepts described herein relate to an interferometric reflectance imaging system. The system can include an imaging sensor including pixels that are preferentially sensitive to a plurality of light components; an illumination source configured to emit illumination light along an illumination path, the illumination light including the plurality of light components; and a target including a target substrate configured to support one or more nanoparticles on a surface of the target substrate. The system may be configured to, at a nominal focus position: generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate; and process the image to detect the nanoparticles on the target substrate.