Pixel Driving Circuit Test Mode Activation for High-Resolution Displays

The patent applies preliminary action by enabling a test mode that can be activated before final product completion. The test controller allows inspection of pixel driving circuits at an early stage (during wafer fabrication or before module assembly) by generating test signals through existing data lines and scan lines, rather than waiting for complete assembly. This early detection capability addresses the inspection difficulty caused by miniaturization.

The patent implements self-service by utilizing the existing data lines and scan lines that are already part of the miniaturized pixel structure to generate test signals. Instead of adding separate complex test infrastructure, the pixel driving circuit components themselves are used to perform self-inspection. The memory unit, driver, and other circuit elements generate test signals and receive test results through their own data and scan lines, enabling defect detection without external complex equipment.

The patent applies universality by designing the pixel driving circuit components (memory unit, driver, transistors) to serve dual purposes: normal display operation and test signal generation. The same data lines and scan lines used for driving display content are also utilized to input test signals and read test results. The memory unit and driver circuitry function both as display control elements and as test mode signal generators, eliminating the need for separate dedicated test structures in the miniaturized pixel.