Pixel Structure Residue Detection via Defect Pattern

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Solution Overview

Problem

Current methods fail to sensitively detect residues in liquid crystal panel pixel structures, leading to defects such as coupled capacitance and short circuits, as they cannot effectively identify residues causing voltage abnormalities.

Innovation Solution

A pixel structure with intersecting scan and data lines, a thin film transistor, passivation layer, and a defect detection pattern that allows the pixel electrode to contact potential residues, enabling the identification of residues through voltage measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional voltage measurement methods are used to detect residues, then the testing process is simple, but the detection sensitivity is insufficient and residues causing coupled capacitance cannot be identified

Engineering Contradiction:
Improvedetection sensitivityVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The pixel electrode is designed to extend and contact the defect detection pattern before final assembly, establishing a pre-configured detection pathway. This preliminary action ensures that if residues are present, they will be directly contacted by the pixel electrode during normal operation, enabling automatic detection without additional testing equipment.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The defect detection pattern serves as an intermediary element between the pixel electrode and the substrate. It provides a controlled interface that allows the pixel electrode to contact potential residues while transmitting voltage signals, thereby enabling indirect detection of residues through voltage measurement without requiring direct access to the residue itself.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the pixel electrode contacts potential residues through the defect detection pattern, then residues can be detected through voltage abnormalities, but the structure becomes more complex

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The defect detection pattern is merged with the existing pixel structure by integrating it into the same substrate and using the same fabrication processes. The pattern shares the substrate with the pixel electrode and other pixel components, thereby adding detection functionality without creating entirely separate detection systems or requiring additional substrates.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The pixel electrode serves dual functions: it performs its primary function of controlling liquid crystal molecules while simultaneously serving as a detection electrode that contacts the defect detection pattern to identify residues. This multi-functionality eliminates the need for separate detection electrodes or testing structures.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If residues are not detected, then coupled capacitance and short circuit defects occur, but conventional methods cannot sensitively identify residues causing voltage abnormalities

Engineering Contradiction:
Improvevoltage measurement sensitivityVSAvoidcoupled capacitance effect
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The system implements feedback by measuring the voltage at the pixel electrode and comparing it against expected values. If residues are present and contacted by the pixel electrode, they cause coupled capacitance that alters the voltage, which is then detected through the measurement circuit. This feedback mechanism enables automatic identification of defective pixels.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The invention exploits parameter changes in voltage caused by coupled capacitance effects. When the pixel electrode contacts residues, the electrical parameters (voltage, capacitance) change due to the formation of coupled capacitance between the residue and adjacent conductive lines. By monitoring these parameter changes, residues can be detected even though they are electrically passive objects.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The pixel structure effectively detects and locates residues, preventing defects by measuring abnormal voltages and allowing for precise repair, thereby improving the reliability of liquid crystal panels.

Implementation Method 1

If the residue 13 were located at an overlap region of the data line and the pixel electrode 122, a coupled capacitance will be generated between the residue 13 and the pixel electrode 122

Methodology Applied
Scientific EffectCoupled capacitance: Parasitic Capacitance

Data Source

PatentUS8030650B2Pixel structure and methods for fabricating, detecting, and repairing the pixel structure
Publication Date: 2011.10.04 AU OPTRONICS CORP
  • US8030650B2 patent drawing
  • US8030650B2 patent drawing
  • US8030650B2 patent drawing

AI summary

A pixel structure comprises at least two scan and data lines. The scan and data lines substantially intersects one another to form at least one region therein. The pixel structure further comprises at least one thin film transistor, at least one passivation layer, at least one defect detection pattern, and at least one pixel electrode. The pixel electrode is disposed on the passivation layer and electrically connected to the thin film transistor via an opening of the passivation layer. The defect detection pattern is disposed in the region to detect whether any residue remains therebelow.