Photodetector Pixel Trench Layout for Manufacturable IR Absorption

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Solution Overview

Problem

Existing pixel designs with trenches for increasing light path in silicon photodetectors face challenges in manufacturing due to optimized trench dimensions and pitches for infrared light, leading to defects in the pattern formation during microelectronic fabrication processes.

Innovation Solution

The proposed pixel design incorporates first and second trenches with notches in the central region, forming a pattern similar to a grid with rotational symmetry, allowing for improved light absorption while being manufacturable using standard microelectronic processes by avoiding complete grid formation in the central region and using notches to mimic the desired pattern.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If first and second trenches are added to increase light path, then quantum efficiency is improved, but manufacturability with standard fabrication processes deteriorates

Engineering Contradiction:
Improvequantum efficiencyVSAvoidmanufacturability
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The trench structure is segmented into first trenches extending in a first direction and second trenches extending in a second direction perpendicular to the first direction. This segmentation allows each trench set to be formed using separate fabrication steps, making the overall structure compatible with standard microelectronic fabrication processes while maintaining the light-path enhancement effect.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a third dimension by adding notches that extend vertically from the trench bottoms toward the surface. These notches create additional light scattering paths without requiring the trenches to cross each other, thus maintaining manufacturability while improving quantum efficiency.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If trenches are made to cross each other to maximize light absorption, then light path is increased, but fabrication complexity increases

Engineering Contradiction:
Improvelight absorptionVSAvoidfabrication complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The trench system is divided into two independent sets: first trenches extending in one direction and second trenches extending perpendicular to them. Neither set crosses the other, allowing each to be formed in separate fabrication steps without requiring complex alignment or additional processing for intersections.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Instead of having trenches cross in the horizontal plane, the patent uses vertical notches extending from the trench bottoms to create additional light scattering paths. This vertical dimensionality avoids the fabrication complexity of crossing trenches while maintaining effective light absorption.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances the quantum efficiency of the photodetector by dispersing light at normal incident angles, increasing the light pathlength, and improves manufacturability by ensuring adequate photoresist mask adherence during etching.

Implementation Method 1

The trenches 112 and 114... allow to increase the light path in the silicon of the photodetector

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

increase the light path in the silicon of the photodetector, thus increasing the quantum efficiency

Methodology Applied
Scientific EffectLight refraction: Refraction

Implementation Method 3

a silicon portion forming a photodetector... configured to received light, for example infra-red light

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentEP4492468A1pixel
Publication Date: 2025.01.15 STMICROELECTRONICS INT NV
  • EP4492468A1 patent drawingFigure 1~2
  • EP4492468A1 patent drawingFigure 3~4
  • EP4492468A1 patent drawingFigure 5~6

AI summary

The present disclosure relates to a pixel (Pix3) comprising, on a first face, first trenches (302) parallel to a first direction (Y) and regularly spaced in a second direction (X) and second trenches (304) parallel to the second direction (X) and regularly spaced in the first direction (Y). The first trenches (302) comprise first notches (320) each extending from a first trench (320) and being aligned with a corresponding second trench (304). The second trenches (304) comprise second notches (322) each extending from a second trench (304) and being aligned with a corresponding first trench (302).