CMOS Image Sensor Pixel Voltage Attenuator for Dynamic Range

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Solution Overview

Problem

CMOS image sensors face limitations in utilizing their dynamic range effectively, particularly in multi-sum modes where pixel voltages exceed the input range of comparators, leading to insufficient dynamic range utilization.

Innovation Solution

Incorporating a voltage attenuator that adjusts pixel voltages by a predetermined ratio in multi-sum modes, using a voltage division method to ensure the adjusted voltages are within the input range of comparators, thereby allowing for the full utilization of the dynamic range.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If pixel binning is used to combine charges from multiple pixels, then sensitivity is improved, but the dynamic range is reduced due to voltage overflow

Engineering Contradiction:
ImprovesensitivityVSAvoiddynamic range
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The voltage attenuator serves as an intermediary component between the pixel circuit and the comparator. It receives the output signal from the pixel circuit and attenuates the pixel voltage by a predetermined ratio (e.g., 1/2 or 1/4) before transmitting it to the comparator. This prevents voltage overflow while preserving the signal information, allowing the system to maintain both high sensitivity through pixel binning and full dynamic range utilization.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The invention changes the voltage parameter by introducing a voltage attenuator that modifies the pixel voltage level. The attenuator adjusts the voltage by a predetermined ratio based on the binning mode (e.g., 2x binning uses 1/2 ratio, 4x binning uses 1/4 ratio), transforming the high-voltage overflow condition into a suitable voltage range for the comparator, thereby enabling full dynamic range utilization.

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If pixel voltages are directly input to comparator, then device complexity is minimized, but dynamic range utilization is insufficient due to voltage exceeding input range

Engineering Contradiction:
Improvecircuit complexityVSAvoiddynamic range utilization
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The voltage attenuator is inserted as an intermediary component between the pixel circuit and the comparator. Although this adds one component to the circuit, it enables full dynamic range utilization by preventing voltage overflow. The attenuator's simple voltage division function (using resistors or transistor-based circuits) keeps the added complexity minimal while achieving the goal of utilizing the full comparator input range.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Adaptability or versatility

If voltage attenuator is added to adjust pixel voltages, then dynamic range utilization is improved, but device complexity increases

Engineering Contradiction:
Improvedynamic range utilizationVSAvoidcircuit complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The voltage attenuator implements parameter change by adjusting the voltage level through a predetermined ratio based on the binning mode. The attenuator can be implemented using simple resistor voltage dividers or transistor-based circuits that provide the required attenuation (1/2 for 2x binning, 1/4 for 4x binning) without requiring complex control logic or additional processing stages, thus minimizing the increase in device complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables the CMOS image sensor to effectively use its dynamic range, improving signal-to-noise ratio and image quality by ensuring pixel voltages are within the comparator's input range, even in high-sensitivity or low-illumination conditions.

Implementation Method 1

using a voltage division method to ensure the adjusted voltages are within the input range of comparators

Methodology Applied
Scientific EffectVoltage division: Electrical Resistance

Implementation Method 2

each pixel including photoelectric conversion element and structured to receive incident light and output an output signal having pixel voltages in response to the received incident light

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS10880500B2Pixel apparatus and CMOS image sensor using the same
Publication Date: 2020.12.29 SK HYNIX INC
  • US10880500B2 patent drawing
  • US10880500B2 patent drawing
  • US10880500B2 patent drawing

AI summary

A pixel apparatus may include a pixel circuit and a voltage attenuator. The pixel circuit includes multiple pixels, each pixel including photoelectric conversion element. The pixel circuit is structured to receive incident light and output an output signal having pixel voltages in response to the received incident light. The pixel circuit operates in at least one of a quad mode outputting the output signal based on photocharges from a single photoelectric conversion element only and a multi-sum mode outputting the output signal based on photocharges from multiple photoelectric conversion elements. The voltage attenuator is coupled to the pixel circuit. The voltage attenuator can be enabled, when the pixel circuit operates in the multi-sum mode, to receive the output signal and adjust the pixel voltages of the output signal by a predetermined ratio determined by the multi-sum mode.