Pixelated Capacitive Sensor Signal Analysis
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Solution Overview
Problem
CMOS-based sensors face challenges in measuring complex variables while maintaining backwards compatibility with simpler variables, limiting the development of scalable and structured designs that are truly CMOS-compatible.
Innovation Solution
A method for analyzing pixelated capacitive sensor signals by classifying capacitance values and assigning attributes to sensor cells, allowing for the measurement of physical parameters and properties, including gas concentration, motion, and pressure, through data fusion algorithms, within a CMOS-compatible design.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If new sensor designs are developed to measure challenging variables, then measurement capability for complex variables is improved, but backwards compatibility with simple variables deteriorates
Solution Approach 1:
The pixelated capacitive sensor array is designed with universal sensor cells that can measure both simple variables (temperature, light intensity) and challenging variables (gas concentration, motion, pressure) using the same capacitive sensing mechanism. The sensor platform provides multi-functionality through a unified architecture that maintains backwards compatibility while enabling measurement of complex physical quantities.
2Ease of manufacture
If pixelated capacitive sensor arrays are implemented, then CMOS compatibility and scalability are improved, but device complexity increases
Solution Approach 1:
The sensor is divided into an array of identical, independent pixel cells, each containing the same capacitive sensing structure. This segmentation allows the complex sensing function to be distributed across many simple, identical units that can be manufactured using standard CMOS processes. Each pixel cell is structurally simple but collectively they provide sophisticated multi-parameter measurement capabilities.
Data Source
AI summary
In an embodiment, a method for analyzing signals from a pixelated capacitive sensor is disclosed. The method involves classifying capacitance signals from sensor cells of a pixelated capacitive sensor into at least one class based on capacitance values for sensor cells indicated by corresponding capacitance signals and assigning an attribute to sensor cells based on the classification of the corresponding capacitance signals.