Planar Coil Stack Sensing for Moving Multilayer Electrode Characterization
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Solution Overview
Problem
Existing measurement systems for characterizing multilayer structures with different ohmic properties are complex, difficult to integrate into manufacturing processes, and provide insufficient information, especially when the structure is in motion, and cannot comprehensively characterize the electrical properties of high-resistance layers.
Innovation Solution
A measuring system comprising a sensor module with planar coils arranged in a coil stack, an electrical switching device, and measuring electronics, allowing the coils to be switched between measuring and reference configurations to determine both inductive and capacitive properties of the layers, enabling full-surface characterization without contact.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray measurement systems are used to characterize multilayer structures, then measurement precision is improved, but device complexity increases and integration into manufacturing processes becomes difficult
Solution Approach 1:
The patent replaces complex X-ray measurement systems with a simpler electromagnetic measurement system using planar coils. The measuring sensor uses planar coils to generate electromagnetic fields that interact with the multilayer structure, detecting electrical properties (conductivity, permittivity) of layers without requiring complex X-ray transmission or refraction equipment. This substitution maintains measurement capability while dramatically reducing system complexity and enabling easy integration into manufacturing processes.
2Measurement precision
If optical measuring systems operating according to the confocal principle are used, then measurement precision is improved, but the ability to perform full-surface inspection of moving structures is reduced
Solution Approach 1:
The patent creates a measurement system with universal applicability to moving multilayer structures. The planar coil-based sensor can perform full-surface inspection by detecting electromagnetic properties across the entire structure surface, unlike confocal optical systems limited to specific points. The system adapts to moving structures through continuous scanning capability and real-time data acquisition, providing both full-surface coverage and precise characterization of electrical properties during manufacturing processes.
3Measurement precision
If measurement systems are designed to characterize electrical properties of high-resistance layers, then measurement precision for electrical properties is improved, but device complexity and integration effort increase
Solution Approach 1:
The patent merges the detection of multiple electrical properties (conductivity and permittivity) into a single integrated measurement system using planar coils. By measuring both properties simultaneously through electromagnetic field interactions, the system provides comprehensive characterization of high-resistance layers without requiring separate measurement devices. This unified approach reduces integration effort while maintaining high measurement precision for electrical properties.
4Measurement precision
If multiple measurement methods are used to comprehensively characterize multilayer structures, then measurement precision is improved, but device complexity and integration effort increase
Solution Approach 1:
The patent creates a universal electromagnetic measurement system using planar coils that can characterize multiple layer properties (thickness, conductivity, permittivity) through a single integrated sensor. The system measures both low-resistance and high-resistance layer properties simultaneously by analyzing electromagnetic field interactions, eliminating the need for multiple separate measurement methods. This multi-functional approach provides comprehensive structure characterization while reducing device complexity and integration effort.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides high-precision, comprehensive characterization of multilayer structures with minimal integration effort, accurately determining layer thickness and other properties, even when the structure is moving, by using planar coils that can operate as both inductive and capacitive sensors.
Implementation Method 1
the planar coils at least partially form an inductive or capacitive measuring sensor
Implementation Method 2
the planar coils at least partially form an inductive or capacitive measuring sensor
Data Source
Figure 1a~1b
Figure 2a~2b
Figure 3a~3b
AI summary
Measuring system (1) for characterizing a multi-layer structure with layer-by-layer different ohmic properties, in particular a battery electrode (B), with a sensor module (2), an electrical switching device (3) and measuring electronics, wherein the sensor module (2) comprises more than two planar coils (4, 5, 6, 7, 8) which are arranged in a coil stack and wherein the electrical switching device (3) is contacted with the planar coils (4, 5, 6, 7, 8) and is designed to connect the planar coils (4, 5, 6, 7, 8) to the measuring electronics in such a way that the planar coils (4, 5, 6, 7, 8) are switchable between at least one measuring configuration and a reference configuration, wherein in the measuring configuration the planar coils (4, 5, 6, 7, 8) at least partially form an optionally inductive or capacitive measuring sensor, the detection range of which is outside the sensor module (2),to determine a property of a low-resistance layer (N) and/or high-resistance layer (H) of the structure and, in the reference configuration, the planar coils (4, 5, 6, 7, 8) at least partially form an optionally inductive or capacitive reference sensor whose detection range extends substantially within the sensor module (2) in order to determine a sensor module property.