Planar Coil Sensor Module for Single-Sided Multilayer Ohmic Sensing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing measuring systems for characterizing multilayer structures with different ohmic properties are either technically complex, prone to environmental influences, or provide inadequate information, and are not integratable with low expenditure for comprehensive characterization, especially in manufacturing processes involving moving structures like battery electrodes.
Innovation Solution
A measuring system comprising a sensor module with multiple planar coils, an electrical switching device, and measuring electronics, allowing for inductive and capacitive measurements on one side of the structure, enabling accurate determination of layer thickness and properties through action direction reversal and sensor module properties compensation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If x-ray measuring systems are used for nondestructive characterization, then measurement capability is improved, but device complexity increases and susceptibility to environmental influences worsens
Solution Approach 1:
The patent replaces complex x-ray measuring systems with a simpler electromagnetic field-based sensor system using planar coils. The sensor module uses electrical fields to characterize multilayer structures, substituting mechanical/optical/x-ray systems with an electromagnetic field approach that is less complex and more environmentally stable.
2Measurement precision
If optical measuring systems are used for surface characterization, then measurement precision is improved, but comprehensive characterization capability deteriorates
Solution Approach 1:
The sensor module with planar coils is designed to perform multiple measurement functions simultaneously. It can characterize both surface properties and subsurface layer structures through electromagnetic field interactions, providing comprehensive information about multilayer structures including thickness, material composition, and electrical properties in a single measurement system.
3Measurement precision
If point-based optical measurement is used, then measurement precision at specific points is improved, but comprehensive structure checking deteriorates
Solution Approach 1:
The patent transitions from point-based optical measurement to area-based electromagnetic field measurement. The planar coils create electromagnetic fields that interact with the entire multilayer structure over a measurement area, enabling comprehensive characterization of the whole structure rather than just specific points, while maintaining measurement precision through field-based detection.
4Productivity
If measuring systems are integrated into manufacturing processes for moving structures, then productivity is improved, but integration complexity and expenditure increase
Solution Approach 1:
The sensor module uses planar coils that can be implemented as simple, inexpensive printed circuit board traces or thin-film structures. This allows for low-cost integration into manufacturing lines for characterizing moving structures like battery electrodes, eliminating the need for expensive, complex measurement systems while maintaining measurement capability.
5Ease of manufacture
If single-sided measurement is used, then integration effort is reduced, but measurement completeness deteriorates
Solution Approach 1:
The electromagnetic field approach allows the sensor to detect properties of multiple layers from a single side of the structure. The field penetrates through the low-resistance layer to interact with the high-resistance layer, enabling comprehensive characterization of all layers without requiring access to both sides, thus reducing integration effort while maintaining measurement completeness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables comprehensive, accurate, and contactless characterization of multilayer structures with low integration effort, suitable for battery electrodes, by using planar coils to determine layer thickness and electrical properties with high precision, compensating for sensor drift due to temperature and moisture variations.
Implementation Method 1
The planar coils at least partially form an inductive or capacitive sensor
Implementation Method 2
The planar coils at least partially form an inductive or capacitive sensor
Data Source
AI summary
A measuring system for characterizing a multilayered structure with layer-by-layer different ohmic properties, having a sensor module, an electrical switching device, and a measuring electronics unit. The sensor module has more than two planar coils arranged in a stack, and the electrical switching device is contacted with the planar coils and is configured to connect these coils to the measuring electronics unit such that the coils are switchable between a measuring configuration and a reference configuration. In the measuring configuration, the planar coils at least partially form an optionally inductive or capacitive measuring sensor, with the detection area extending outside the sensor module for determining a property of a low and/or high-resistance layer of the structure. In the reference configuration, the planar coils at least partially form an optionally inductive or capacitive reference sensor, with the detection area extending essentially inside the sensor module for determining a sensor module property.