Planar Light Sample Observation for Single-Scan Multi-Wavelength Imaging
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Solution Overview
Problem
Existing sample observation devices require multiple scans with planar light of different wavelengths, leading to prolonged data acquisition times.
Innovation Solution
A sample observation device that emits first and second planar light with different wavelengths to pass through distinct positions of a sample, using an imaging optical system with an inclined observation axis to acquire and generate observation image data from both light images in a single scan.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple scans are performed with planar light of different wavelengths, then observation image data can be acquired with high quality, but the time required to obtain observation image data increases
Solution Approach 1:
The patent divides the light detection process into multiple independent photodetectors, each detecting light of different wavelengths simultaneously. This segmentation allows parallel acquisition of multi-wavelength data without requiring sequential scanning, thereby reducing acquisition time while maintaining observation quality
Solution Approach 2:
The patent transitions from temporal multiplexing (sequential scanning at different wavelengths) to spatial multiplexing (simultaneous detection at different wavelengths using multiple photodetectors positioned at different locations). This dimensional change from time to space enables parallel data acquisition
2Loss of information
If multiple scans are performed with planar light of different wavelengths, then comprehensive observation data can be obtained, but throughput decreases
Solution Approach 1:
The patent merges multiple wavelength detection functions into a single scanning process by using multiple photodetectors that simultaneously detect different wavelengths. This combining of detection functions eliminates the need for separate scanning operations, thereby improving throughput while maintaining comprehensive observation data
Solution Approach 2:
The patent enables continuous useful action by performing multi-wavelength detection simultaneously in a single continuous scan, rather than interrupting the scan process to change wavelengths. This continuous operation maintains high throughput while acquiring comprehensive data
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves throughput by allowing observation image data acquisition in a single scan, while ensuring high accuracy and reduced background noise.
Implementation Method 1
an imaging optical system having an observation axis inclined with respect to the first irradiation surface and the second irradiation surface and imaging a light image of first observation light generated in the sample by irradiation with the first planar light and a light image of second observation light generated in the sample by irradiation with the second planar light
Data Source
AI summary
A sample observation device includes an irradiation optical system that emits planar light and having different wavelengths so as to pass through cross sections at different positions of the sample, a scanning unit that scans the sample with respect to the irradiation surfaces and, an imaging optical system that has an observation axis inclined with respect to the irradiation surfaces and images each of light images of observation light, an image acquiring unit that acquires each of first image data and second image data during scanning of the sample by the scanning unit, and an image generating unit that generates observation image data and the sample on the basis of the first image data and the second image data.