Automated Plant Diagram Analysis for Defect Detection

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Solution Overview

Problem

Existing design diagram analysis methods, such as those for P&IDs, require extensive manual effort and are prone to errors due to the complexity and large amount of information, leading to inconsistent interpretations and reduced quality in plant design and construction.

Innovation Solution

A diagram analysis apparatus that extracts components and identifies deficiencies like missing symbols, erroneous information, and inconsistent descriptions in design diagrams, using a processor to automate the detection and display of defective portions, thereby simplifying the correction process and improving diagram quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If visual inspection is performed by a user to extract defects or deficiencies in a design diagram, then the defects can be identified and corrected, but a large number of man-hours are required and mistakes are likely to occur due to the complexity and large amount of information

Engineering Contradiction:
Improveextraction accuracyVSAvoidman-hours
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces the manual visual inspection process with an automated computer-based system that uses image recognition and processing algorithms to extract components and their setting information from design diagrams, thereby eliminating the need for extensive manual review while improving accuracy and consistency

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system enables automatic self-verification of design diagrams by extracting component information and comparing it against predefined standards and rules, allowing the diagram itself to be analyzed and validated without requiring extensive manual intervention

Inventive Principle:
Principle #25Self-service

2Productivity

If component groups are searched and compared to extract defective portions, then operation efficiency is improved, but the system becomes complex and requires multiple processing steps

Engineering Contradiction:
Improveoperation efficiencyVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent segments the design diagram into individual components and their associated setting information, allowing the system to process and analyze each component independently through automated extraction and comparison operations, thereby improving efficiency without requiring complex overall system restructuring

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes the approach from comparing entire component groups to extracting and comparing specific setting information parameters of individual components, simplifying the processing logic while maintaining or improving operational efficiency through targeted parameter analysis

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20240419865A1Diagram analysis apparatus, diagram analysis method, and non-transitory computer readable recording medium
Publication Date: 2024.12.19 YOKOGAWA ELECTRIC CORP
  • US20240419865A1 patent drawing
  • US20240419865A1 patent drawing
  • US20240419865A1 patent drawing

AI summary

A diagram analysis apparatus includes a processor configured to extract, from a design diagram of a plant, components of the design diagram, and identify a setting position of setting information corresponding to an identification condition in the design diagram or a setting detail of the setting information in the design diagram or any combination thereof, based on the components of the design diagram.