Industrial Plant Model Correlation via Spatial Scan and PID Integration
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Solution Overview
Problem
Current methods for generating information-enhanced models of industrial plants are inefficient in correlating spatial scans and process and instrumentation diagrams, leading to inconsistencies and ambiguities, which hinder accurate representation and visualization of plant structures and their interconnections.
Innovation Solution
A method that processes spatial or 3D scans and process and instrumentation diagrams to create digitalized topologies, correlating structural elements and interconnections semi-automatically, and provides a visual model with augmented reality capabilities, enabling user access to database information through PID-tags, and automatically detects and adjusts discrepancies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If spatial scans and PID diagrams are correlated manually, then accuracy of structural element identification can be maintained, but the process becomes time-consuming and inefficient
Solution Approach 1:
The patent introduces an intermediary correlation system that uses unique identifiers (tags) from PID diagrams and spatial coordinate data from scans as mediating elements. These intermediaries enable automatic matching between physical plant elements and their functional representations without requiring manual correlation, thus resolving the contradiction between accuracy and time efficiency.
Solution Approach 2:
The manual mechanical process of correlating scans and PIDs is replaced by an automated computational system using algorithms to match structural elements based on their identifiers and spatial relationships. This substitution eliminates manual labor while maintaining correlation accuracy through systematic data processing.
2Productivity
If automated correlation methods are used to speed up the process, then processing speed improves, but inconsistencies and ambiguities increase
Solution Approach 1:
The system implements feedback mechanisms where correlation results are continuously validated against multiple data sources including scan data, PID information, and interconnection relationships. Discrepancies detected during automated correlation trigger validation routines that verify element identities and relationships, ensuring consistency while maintaining high processing speed.
Solution Approach 2:
The patent performs preliminary processing of both scan data and PID diagrams to extract and standardize element identifiers, spatial coordinates, and interconnection information before the actual correlation process. This preliminary preparation ensures that the automated correlation has clean, consistent data to work with, reducing ambiguities while maintaining speed.
3Manufacturing precision
If detailed processing of scan data is performed to accurately identify structural elements, then model accuracy improves, but computational complexity increases
Solution Approach 1:
The patent segments the complex correlation task into distinct processing stages: scan data preprocessing, element identification, PID diagram parsing, and correlation matching. Each stage handles a specific aspect of the problem independently, reducing overall computational complexity while maintaining high accuracy through focused processing at each stage.
Data Source
AI summary
A method of generating an information enhanced model of an industrial plant. The method includes providing a first digitalized topology of a plant by processing a spatial scan of the plant, wherein in course of the processing, plant structural elements and their interconnections are recognized and digitalized, providing a second digitalized topology of the plant, based on a process and instrumentation diagram, the second topology being representative of plant structural elements and their interconnections, and correlating the first and the second digitalized topology by at least semi-automatically identifying and interlinking corresponding structural elements in the first and second digitalized topology.


