Plant Sensor Dual-Wavelength Scanning for Soil Noise Filtering
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Solution Overview
Problem
Existing methods for detecting plant growth conditions, such as those using diffused detection light, are hindered by noise components from soil reflections, leading to inaccurate plant growth assessments.
Innovation Solution
A method utilizing pulsed distance measuring light with two wavelengths (735 nm and 809 nm) to separate and analyze reflected light, employing threshold values to eliminate noise and accurately determine plant growth conditions based on nitrogen content.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a detection light diffused in one direction is irradiated to detect plant growth condition based on reflected light from leaves, then the detection method is simple, but the reflected light from soil acts as noise and reduces measurement precision
Solution Approach 1:
The patent segments the reflected light detection into multiple wavelength channels (735nm and 809nm). By dividing the detection into different wavelength segments, the system can distinguish between leaf reflections and soil reflections based on their different spectral characteristics, thereby improving measurement precision while maintaining relatively simple device complexity
Solution Approach 2:
The patent changes the detection parameter from single-wavelength reflected light intensity to multi-wavelength reflected light ratio. By measuring the ratio of reflected light intensities at different wavelengths (735nm/809nm), the system can identify leaf reflections versus soil reflections, as leaves and soil have different reflectance characteristics at these wavelengths, thus improving growth condition detection accuracy
2Measurement precision
If pulsed distance measuring light with two wavelengths is used to separate and analyze reflected light, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent applies a laser scanner that can emit pulsed light at multiple wavelengths (735nm and 809nm) to perform both distance measurement and plant growth detection functions. This multi-functional approach improves measurement precision by enabling wavelength-based differentiation of leaf and soil reflections, while avoiding the need for separate detection systems for each function, thus limiting the increase in device complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances measurement accuracy by distinguishing leaf reflections from soil noise, enabling instant data acquisition and precise growth condition detection.
Implementation Method 1
performing a scan using a pulsed distance measuring light with two wavelengths, of which reflectances are different with respect to a content of a nitrogen, by a laser scanner
Implementation Method 2
receiving separated lights, detecting a distance measurement value and a light amount for each pulsed distance measuring light and for each of the two wavelengths
Data Source
AI summary
A scan using a pulsed distance measuring light with two wavelengths of which reflectances are different with respect to a content of a nitrogen by a laser scanner, the two wavelengths are separated, lights are received, a distance measurement value and a light amount are detected for each pulsed distance measuring light and for each of the two wavelengths, a height of a crop is detected based on the distance measurement value, a received light amount ratio of the two wavelengths is detected, and a growth condition of the crop is detected based on the detected height and the received light amount ratio.