Plasma Reaction Vessel Baffle Layout for Higher Substrate Throughput

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Solution Overview

Problem

Conventional substrate processing apparatuses struggle to generate plasma with high density, leading to low throughput in substrate processing.

Innovation Solution

A substrate processing apparatus is designed with a reaction vessel, an electrode, a baffle without holes, and a gas exhaust pipe, where specific distance relationships between vessel, baffle, and electrode components enhance plasma generation efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a conventional substrate processing apparatus is used, then the structure is simple and easy to manufacture, but plasma density is low and throughput is low

Engineering Contradiction:
ImprovethroughputVSAvoidapparatus structure
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The reaction vessel is divided into multiple regions by introducing a baffle structure that segments the plasma generation space. This segmentation creates distinct zones for different functions (plasma generation, substrate processing, gas flow control), allowing each region to be optimized independently while working together to achieve high plasma density and improved throughput

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A baffle structure is introduced as an intermediary component between the electrode and substrate. This baffle serves as a mediator that controls plasma distribution, regulates gas flow patterns, and optimizes the interaction between plasma and substrate, thereby enhancing plasma density without requiring fundamental changes to the overall apparatus design

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If plasma density is increased to improve throughput, then processing efficiency improves, but energy consumption increases

Engineering Contradiction:
ImprovethroughputVSAvoidenergy consumption
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The baffle structure creates localized regions of high plasma density near the substrate surface while maintaining lower plasma density in other regions. This local quality optimization ensures that energy is concentrated where it is most needed (at the substrate for effective processing) rather than being distributed uniformly throughout the entire reaction vessel, thereby improving throughput while controlling energy consumption

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The apparatus utilizes parameter changes in gas flow rates, pressure conditions, and electromagnetic field distribution to optimize plasma density. By dynamically adjusting these parameters in different regions of the reaction vessel, the system achieves high plasma density for improved throughput while minimizing overall energy consumption through efficient parameter optimization

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus achieves high throughput in substrate processing by generating plasma with increased density and energy, improving processing efficiency.

Implementation Method 1

exciting the gas into a plasma state by the electrode

Methodology Applied
Scientific EffectPlasma generation: Plasma

Implementation Method 2

radio frequency power is supplied to a coil to generate an electric field in a plasma generating space

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentUS20260081115A1Substrate processing apparatus and method of manufacturing semiconductor device
Publication Date: 2026.03.19 KOKUSAI DENKI KK
  • US20260081115A1 patent drawing
  • US20260081115A1 patent drawing
  • US20260081115A1 patent drawing

AI summary

A conventional substrate processing apparatus for generating plasma cannot generate plasma with high density and thus throughput of substrate processing is low. In order to solve this problem, provided is a substrate processing apparatus including a reaction vessel; a gas introduction port installed at an upper end of the reaction vessel; an electrode installed along an outer circumference of the reaction vessel; a baffle installed between the upper end of the reaction vessel and an upper end of the electrode with a gap between an outer circumference of the baffle and an inner circumference of the reaction vessel along the outer circumference of the baffle; a fixing part attached to an inner plane of the baffle and disposed inside the outer circumference of the baffle so as to fix the baffle to the upper end of the reaction vessel; and a gas exhaust pipe connected to the reaction vessel.