Plasma-Bonded Substrates for Dense Electrical and Fluidic Interconnects
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Solution Overview
Problem
Existing microfluidic device manufacturing techniques struggle to efficiently bond substrates with both electrical conductors and fluidic channels, limiting interconnect density and compatibility with non-silicon substrates.
Innovation Solution
Plasma bonding is used to form direct electrical and fluidic interconnects between substrates, with the introduction of a dielectric or amorphous silicon layer on non-silicon substrates to facilitate bonding, allowing for interconnect formation even with non-silicon materials.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If conventional bonding techniques are used to bond substrates with electrical conductors and fluidic channels, then the bonding process is simpler, but interconnect density is limited
Solution Approach 1:
The bonding process is segmented into distinct stages: plasma treatment of bonding surfaces, alignment of substrates with conductors and fluidic channels, and controlled bonding. This segmentation allows each stage to be optimized independently, achieving both high interconnect density and manufacturing feasibility
Solution Approach 2:
Plasma treatment parameters (power, gas flow rate, treatment duration) are precisely controlled to activate bonding surfaces without damaging underlying structures. This parameter control enables direct bonding with high interconnect density while maintaining processability
2Manufacturing precision
If direct plasma bonding is used to form electrical and fluidic interconnects, then interconnect density increases, but substrate compatibility is limited
Solution Approach 1:
A plasma treatment layer acts as an intermediary between diverse substrate materials and the bonding interface. This plasma-modified surface layer enables direct bonding of non-silicon substrates (such as glass, polymers, and ceramics) to silicon substrates, achieving high interconnect density across material boundaries
Solution Approach 2:
The bonding interface creates a composite structure where plasma-treated surfaces of different materials are directly bonded. This composite approach allows electrical conductors and fluidic channels from different substrate types to be interconnected with high density
3Device complexity
If existing bonding techniques are used for substrates with both electrical conductors and fluidic channels, then process complexity is lower, but integration of electrical and fluidic functionalities is limited
Solution Approach 1:
The bonding process merges the formation of electrical and fluidic interconnects into a single plasma bonding step. Conductors and fluidic channels are bonded simultaneously, creating integrated devices with both electrical and fluidic functionalities in one process rather than requiring separate bonding operations
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables higher interconnect density and compatibility with diverse substrates, enabling the construction of advanced microfluidic devices with integrated electrical and fluidic functionalities.
Implementation Method 1
Plasma bonding is used to form direct electrical and fluidic interconnects between substrates
Implementation Method 2
with the introduction of a dielectric or amorphous silicon layer on non-silicon substrates to facilitate bonding
Data Source
AI summary
A device includes first and second substrates. The first substrate has one or multiple first channels and one or multiple first conductors that are exposed at a first surface of the first substrate. The second substrate has one or multiple second channels and one or multiple second conductors that are exposed at a second surface of the first substrate. The first and second substrates are plasma bonded together at the first and second surfaces, forming direct electrical interconnects between the first and second conductors and direct fluidic interconnects between the first and second channels.


