Plasma Chamber Inspection Tool for Residue Detection and Process Control

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Solution Overview

Problem

Plasma processing systems face challenges in maintaining consistent performance due to particulate matter and residue buildup within the chamber, leading to inefficient wet clean recovery processes, increased energy consumption, and reduced productivity, as existing methods require frequent reconditioning and consumable part replacement.

Innovation Solution

A method and system for constructing tool models that inspect internal chamber conditions using optical data to identify particulate residues and adjust process parameters in real-time, allowing for closed-loop control to maintain performance within predefined windows, thereby extending the time between wet clean operations and reducing consumable part wear.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If wet clean operations are performed frequently to remove particulate residues, then chamber cleanliness is improved, but productivity deteriorates due to loss of processing time and energy consumption

Engineering Contradiction:
Improvechamber cleanlinessVSAvoidprocessing time
Core Design Contradiction:
Object-affected harmful factorsVSProductivity

Solution Approach 1:

The system performs preliminary inspection of chamber surfaces using optical sensors to detect particulate residues before they reach critical levels. By identifying residue accumulation early, the system can schedule wet clean operations proactively rather than reactively, minimizing unplanned downtime and ensuring continuous production flow.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system implements continuous feedback monitoring through optical sensors that detect particulate residues on chamber surfaces in real-time. This feedback loop provides data to the controller, which automatically adjusts processing parameters or schedules maintenance operations based on actual chamber conditions, preventing both premature cleaning and excessive residue accumulation.

Inventive Principle:
Principle #23Feedback

2Object-affected harmful factors

If wet clean operations are extended to ensure thorough cleaning, then chamber cleanliness is improved, but energy consumption increases

Engineering Contradiction:
Improvechamber cleanlinessVSAvoidenergy consumption
Core Design Contradiction:
Object-affected harmful factorsVSLoss of energy

Solution Approach 1:

The system applies partial cleaning actions by using optical sensors to identify specific localized areas with particulate residues. Instead of performing complete chamber cleaning, the system targets only the affected regions with focused cleaning operations, reducing overall energy consumption while maintaining adequate cleanliness levels for continued production.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If consumable parts are replaced frequently to maintain performance, then process reliability is improved, but productivity deteriorates due to replacement time and cost

Engineering Contradiction:
Improveprocess reliabilityVSAvoidoperational time
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system performs preliminary monitoring of consumable part conditions through optical inspection, detecting wear, contamination, or degradation before these factors significantly impact process reliability. This allows for proactive replacement scheduling during planned maintenance windows rather than emergency replacements that disrupt production.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system replaces physical inspection and manual assessment of consumable parts with optical sensing and automated image analysis. This substitution enables continuous, non-contact monitoring of part conditions, providing objective data for replacement decisions and eliminating the need for frequent manual inspections that consume operational time.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Measurement precision

If inspection procedures are made more comprehensive to detect all residues, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveresidue detection accuracyVSAvoidinspection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system employs multi-functional optical sensors that can detect various types of particulate residues (organic, inorganic, metallic) across different wavelength ranges using a single integrated inspection platform. This universal approach achieves comprehensive residue detection without requiring separate specialized inspection systems for each residue type, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system effectively prolongs the operational period between wet clean cycles, reduces energy consumption, and minimizes unnecessary consumable part replacements by dynamically adjusting process parameters based on real-time chamber conditions, enhancing productivity and maintaining consistent process performance.

Implementation Method 1

capturing optical data of said one or more surfaces

Methodology Applied
Scientific EffectOptical reflection: Reflection

Data Source

PatentUS11276564B2Plasma processing system having an inspection tool and controller that interfaces with a tool model
Publication Date: 2022.03.15 LAM RES CORP
  • US11276564B2 patent drawing
  • US11276564B2 patent drawing
  • US11276564B2 patent drawing

AI summary

A system for use in processing a substrate is provided. One system includes a chamber having an interior region that is exposed to plasma when processing a substrate. The internal region includes surfaces of parts of the chamber. A controller is interfaced with the chamber and includes a detector to enable control of a scope. The scope is configured for insertion into the chamber to inspect the interior region of the chamber without breaking a vacuum of the chamber. The detector includes an optical processor for identifying a characteristic of material present on a surface being inspected via the scope. A tool model processor is configured to receive information regarding the identified characteristic of the material present on the surface and interface with a tool model for the chamber to identify an adjustment to a parameter of a process to be performed using the chamber. The adjustment is configured to compensate for an anticipated drift in the process based on the identified characteristic of the material present on the surface and data from the tool model.