Plasma Cleaning Gate Assembly for Dielectric Protection

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Solution Overview

Problem

The existing plasma cleaning apparatuses for semiconductor processes face issues with contamination of dielectrics, leading to arcing and unstable plasma generation, which reduces the cleaning effect and shortens the lifespan of vacuum tubes and pumps due to metal components being applied to the inner walls, causing dielectric breakdown.

Innovation Solution

A plasma cleaning apparatus with a gate assembly and dielectric configuration that prevents metal components from contacting the inner wall during deposition, using a gate plate and actuator to switch positions and apply a driving voltage to a high voltage electrode for plasma generation, thereby preventing arcing and maintaining stable plasma discharge.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If plasma cleaning is performed continuously in the deposition section, then cleaning effect is improved, but metal components accumulate on the dielectric inner wall causing arcing and unstable plasma generation

Engineering Contradiction:
Improveplasma generation stabilityVSAvoidmetal component accumulation on dielectric
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent extracts the harmful function of the dielectric inner wall by introducing a gate structure that prevents process gas and metal components from contacting the dielectric during deposition. The gate acts as a barrier that separates the deposition zone from the dielectric surface, eliminating the contamination problem while allowing plasma cleaning to occur in the metal chamber.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The gate serves as an intermediary element between the process gas flow and the dielectric inner wall. During deposition, the gate blocks metal components from reaching the dielectric; during plasma cleaning, the gate can be opened to allow plasma to contact and clean the metal chamber while the dielectric remains protected.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If a gate structure is added to prevent contamination, then dielectric protection is improved, but device complexity increases

Engineering Contradiction:
Improvedielectric protectionVSAvoidgate assembly structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The gate structure performs multiple functions: it blocks process gas during deposition to protect the dielectric, allows plasma passage during cleaning to maintain cleaning effectiveness, and can be integrated with the existing metal chamber structure. This multi-functionality justifies the added complexity by providing both protection and operational flexibility.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If vacuum pump and vacuum tube are replaced more frequently, then cleaning effectiveness is maintained, but productivity decreases

Engineering Contradiction:
Improvecleaning effectVSAvoidreplacement cycle
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent implements preliminary protection by preventing metal component accumulation on the dielectric through the gate structure during deposition. This preliminary action stops contamination before it occurs, thereby preventing dielectric breakdown and extending the operational lifespan of the vacuum tube and pump, reducing replacement frequency.

Inventive Principle:
Principle #10Preliminary action

4Productivity

If plasma is generated at high power, then cleaning speed is improved, but arcing occurs due to dielectric contamination

Engineering Contradiction:
Improvecleaning speedVSAvoidarcing
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The gate structure provides preliminary anti-action by blocking metal components from contaminating the dielectric before plasma cleaning begins. This prevents the condition that would lead to arcing, allowing high-power plasma to be applied safely without the risk of dielectric breakdown.

Inventive Principle:
Principle #9Preliminary anti-action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the plasma cleaning effect, prevents dielectric breakdown, and extends the lifespan of vacuum tubes and pumps by ensuring stable plasma generation and minimizing contamination.

Implementation Method 1

a driving voltage is applied to the high voltage electrode such that plasma cleaning is performed

Methodology Applied
Scientific EffectPlasma generation: Plasma

Implementation Method 2

plasma is generated at a specific portion of a vacuum tube to generate fluorine radicals or chlorine radicals from cleaning gas

Methodology Applied
Scientific EffectRadical generation: Photodissociation

Implementation Method 3

The gate assembly includes a gate support fixed around the first opening of the metal chamber and having a second opening, and a gate coupled to the gate support and having a first position closing the second opening and a second position opening the second opening

Methodology Applied
Scientific EffectPhysical barrier control: Valve

Data Source

PatentUS11643722B2Plasma cleaning apparatus and semiconductor process equipment with the same
Publication Date: 2023.05.09 KOREA INST OF MACHINERY & MATERIALS
  • US11643722B2 patent drawing
  • US11643722B2 patent drawing
  • US11643722B2 patent drawing

AI summary

A plasma cleaning apparatus includes a metal chamber, a gate assembly, a dielectric, and a high voltage electrode.The metal chamber is connected to a vacuum tube connecting the process chamber and the vacuum pump, and is provided with a first opening. The gate assembly includes a gate support fixed to the metal chamber around the first opening and having a second opening, and a gate coupled to the gate support and having a first position closing the second opening and a second position opening the second opening switchable with each other. The dielectric is coupled to the outside of the gate support around the second opening, and the high voltage electrode is positioned on an outer surface of the dielectric.