Plasma Etching with Protective Film to Prevent Mask Metal Release

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Solution Overview

Problem

Conventional plasma etching methods using metal-containing masks result in metal contamination, leading to degraded recess shapes and potential etching stop issues due to metal release from the mask.

Innovation Solution

A plasma etching method involving a protective film formation process on a metal-containing film, followed by an etching process using the metal-containing film as a mask, with intermittent radio frequency power application for ion attraction to prevent metal release and improve recess shape.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a metal-containing film is used as a mask for plasma etching, then the etching process can be performed, but metal is released from the mask and adheres to the etching target film, degrading the recess shape and causing etching stop

Engineering Contradiction:
Improveetching process efficiencyVSAvoidrecess shape integrity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

A protective film is introduced as an intermediary layer between the metal-containing mask and the etching target film. This protective film prevents direct contact and adhesion between released metal and the target film, while still allowing the etching process to proceed effectively through the protective film.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The protective film is formed on the metal-containing mask before the plasma etching process begins. This preliminary action ensures that the mask surface is prepared in advance to prevent metal release and adhesion during the subsequent etching operation.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If a metal-containing film is used as a mask, then etching can proceed, but the released metal causes tapered sidewalls and critical dimension reduction

Engineering Contradiction:
Improveetching rateVSAvoidcritical dimension control
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The protective film serves as a mediator that allows plasma etching to proceed at effective rates while preventing the harmful interaction between released metal and the etching target film, thereby maintaining critical dimension control and preventing tapered sidewall formation.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The harmful function of the metal-containing mask (releasing metal that adheres to the target film) is separated from its useful function (providing mask pattern). The protective film extracts and isolates the harmful metal release, allowing the mask to perform only its useful patterning function.

Inventive Principle:
Principle #2Taking out (Extraction)

3Reliability

If intermittent radio frequency power is applied for ion attraction, then metal release is prevented, but the process complexity increases

Engineering Contradiction:
Improvemetal release preventionVSAvoidpower control complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Radio frequency power is applied in periodic intervals during the plasma etching process rather than continuously. This periodic application timing creates optimal conditions for ion attraction that prevents metal release from the mask, while allowing plasma generation to occur during other intervals.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method effectively prevents metal contamination and maintains the integrity of recess shapes during etching, avoiding etching stop and enhancing etching precision.

Implementation Method 1

etching an etching target film by plasma generated from a processing gas

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

applying a radio frequency power for attraction of ions in the plasma

Methodology Applied
Scientific EffectIon attraction: Ion Repulsion/Attraction

Implementation Method 3

applying a radio frequency power for attraction of ions in the plasma for a period during which the plasma is being generated from the processing gas

Methodology Applied
Scientific EffectRadio frequency power: Electromagnetic Induction

Data Source

PatentUS12154792B2Plasma etching method
Publication Date: 2024.11.26 TOKYO ELECTRON LTD
  • US12154792B2 patent drawing
  • US12154792B2 patent drawing
  • US12154792B2 patent drawing

AI summary

Etching stop which is caused by a metal released from a metal-containing mask can be avoided. A plasma etching method includes a protective film forming process of forming a protective film on a metal-containing film, which is formed on an etching target film and provided with a preset opening pattern, by a first processing gas; and an etching process of etching the etching target film by plasma generated from a second processing gas while using, as a mask, the metal-containing film on which the protective film is formed.