Plasma Gas Direction Changer for Uniform Etching

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Solution Overview

Problem

In plasma processing devices for display devices, insufficient plasma gas application can lead to incomplete removal of insulating layers near the display area and peripheral area due to surface height differences, causing signal line disconnection issues.

Innovation Solution

A plasma processing device with a gas direction changer featuring a spiral groove design and a nozzle with a gas direction changing filter, which converts the plasma gas flow from linear to turbulent, ensuring uniform gas supply and effective etching across varying surface heights.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If plasma gas is supplied in a linear flow through a conventional nozzle, then the device structure is simple, but the plasma gas cannot be uniformly applied to the insulating layer near the display area and peripheral area due to surface height differences, resulting in incomplete removal

Engineering Contradiction:
Improveuniformity of plasma gas applicationVSAvoidstructure of gas supply system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The gas direction changer incorporates a spiral groove pattern instead of a straight linear channel. This curved/spiral geometry transforms the linear gas flow into a rotational turbulent flow, enabling the plasma gas to reach all areas including those near the display area with varying surface heights, thus achieving uniform plasma gas application across the entire insulating layer surface

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

A gas direction changer is introduced as an intermediary component between the plasma gas source and the insulating layer. This mediator device actively redirects and distributes the plasma gas flow to ensure complete coverage of the insulating layer surface, particularly addressing the areas that were previously inaccessible due to surface height variations

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If a conventional linear nozzle is used, then the device is easy to manufacture, but the etching is incomplete in areas with surface steps between display and peripheral areas

Engineering Contradiction:
Improvecompleteness of insulating layer removalVSAvoidmanufacturing complexity of gas direction changer
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The gas direction changer incorporates a spiral groove pattern instead of a straight linear channel. This curved/spiral geometry transforms the linear gas flow into a rotational turbulent flow, enabling the plasma gas to reach all areas including those near the display area with varying surface heights, thus achieving uniform plasma gas application across the entire insulating layer surface

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The gas flow parameters are fundamentally changed by introducing the spiral groove structure. This transforms the flow regime from laminar/linear to turbulent/rotational, and modifies the flow distribution characteristics to achieve uniform plasma gas application across varying surface heights, ensuring complete etching throughout

Inventive Principle:
Principle #35Parameter changes

3Reliability

If plasma processing is performed without a gas direction changer, then the processing process is simple, but the signal lines cannot be properly connected due to incomplete insulating layer removal

Engineering Contradiction:
Improveconnectivity of signal linesVSAvoidcomplexity of plasma processing device
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A gas direction changer is introduced as an intermediary component between the plasma gas source and the insulating layer. This mediator device actively redirects and distributes the plasma gas flow to ensure complete coverage of the insulating layer surface, particularly addressing the areas that were previously inaccessible due to surface height variations

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The gas direction changer incorporates a spiral groove pattern instead of a straight linear channel. This curved/spiral geometry transforms the linear gas flow into a rotational turbulent flow, enabling the plasma gas to reach all areas including those near the display area with varying surface heights, thus achieving uniform plasma gas application across the entire insulating layer surface

Inventive Principle:
Principle #14Spheroidality (Curvature)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution ensures complete removal of insulating layers, maintaining signal line connectivity by uniformly supplying plasma gas and maintaining consistent etch rates, even with surface steps between the display and peripheral areas.

Implementation Method 1

Process gas may be discharged as a linear flow when passing through the plasma processor, and the process gas may be discharged as a turbulent flow when passing through the gas direction changer

Methodology Applied
Scientific EffectTurbulent flow: Turbulence

Implementation Method 2

a power supply unit; a plasma electrode connected to the power supply unit; a plasma processor in which the plasma electrode is installed

Methodology Applied
Scientific EffectPlasma: Plasma

Data Source

PatentUS20230038597A1Plasma processing device and method for manufacturing display device by using the same
Publication Date: 2023.02.09 SAMSUNG DISPLAY CO LTD
  • US20230038597A1 patent drawing
  • US20230038597A1 patent drawing
  • US20230038597A1 patent drawing

AI summary

A method for manufacturing a display device according to an embodiment includes: forming a display panel including a first substrate, a second substrate facing the first substrate, an emission layer disposed between the first substrate and the second substrate, a pad portion disposed on the first substrate, and a thin film encapsulation layer disposed on the pad portion; removing the thin film encapsulation layer disposed on the pad portion by using a plasma processing device; and attaching a flexible circuit board on which an integrated circuit chip is mounted to the pad portion exposed by removing the thin film encapsulation layer.