Plasma-Polymerized Barrier Layer for Optoelectronic Components

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Solution Overview

Problem

Optoelectronic components with polysiloxane encapsulations are prone to gas permeability issues, leading to degradation and loss of brightness when exposed to harmful gases like VOCs, which compromises their stability and performance.

Innovation Solution

Incorporating a plasma-polymerized barrier layer on the encapsulation, which is characterized by low gas permeability and high cross-linking, effectively prevents the permeation of harmful gases, maintaining the component's stability and performance even in the presence of VOCs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a polysiloxane encapsulation is used, then the component achieves good chemical stability and protection, but harmful gases can permeate through the encapsulation and reach the semiconductor chip

Engineering Contradiction:
Improvechemical stabilityVSAvoidgas permeability
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent combines polysiloxane encapsulation with a plasma-polymerized barrier layer to create a composite protective structure. The polysiloxane provides chemical stability and mechanical protection, while the plasma-polymerized layer ( deposited via PECVD or atmospheric plasma) provides gas impermeability. This composite approach resolves the contradiction by integrating materials with complementary properties.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent applies a thin plasma-polymerized film on the polysiloxane encapsulation surface. This thin film acts as a flexible barrier that prevents gas permeation while maintaining the overall flexibility and protective function of the encapsulation structure.

Inventive Principle:
Principle #30Flexible shells and thin films

2Object-affected harmful factors

If the encapsulation is made more gas-tight to prevent VOC permeation, then gas protection improves, but the component complexity increases

Engineering Contradiction:
Improvegas protectionVSAvoidencapsulation structure
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The plasma-polymerized barrier layer is applied as a thin film (typically tens to hundreds of nanometers) on the encapsulation surface. This thin-film approach provides effective gas protection without significantly increasing the overall component complexity or size.

Inventive Principle:
Principle #30Flexible shells and thin films

Solution Approach 2:

The patent replaces complex multi-layer mechanical barrier structures with a plasma-polymerized coating applied via PECVD or atmospheric plasma processes. This substitution simplifies the manufacturing process while achieving the desired gas-tight properties.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The plasma-polymerized barrier layer significantly enhances the optoelectronic component's resistance to VOCs, ensuring long-term brightness and color stability, allowing for safe integration with VOC-emitting materials without performance degradation.

Implementation Method 1

the barrier layer is characterized by a lower permeability for harmful gases than the polysiloxane contained in the encapsulation

Methodology Applied
Scientific EffectPermeation: Permeation

Implementation Method 2

the barrier layer is a plasma-polymerized layer

Methodology Applied
Scientific EffectPlasma polymerization: Plasma

Data Source

PatentUS11398588B2Optoelectronic component and method for producing an optoelectronic component
Publication Date: 2022.07.26 AMS OSRAM INT GMBH
  • US11398588B2 patent drawing
  • US11398588B2 patent drawing
  • US11398588B2 patent drawing

AI summary

An optoelectronic component and a method for producing an optoelectronic component are disclosed. In an embodiment an optoelectronic component includes at least one optoelectronic semiconductor chip configured to emit radiation and an encapsulation around the semiconductor chip. The encapsulation is a polysiloxane. A barrier layer can be used for protection against harmful gases, the barrier layer being arranged on the encapsulation. The barrier layer is a plasma-polymerized siloxane layer.