Real-Time Pulse Timing Adjustment for Uniform Pulsed Plasma

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional plasma processing systems face challenges in maintaining uniform plasma distribution and optimal plasma density, particularly as substrate geometries shrink, due to inadequate control over plasma properties such as density, ion flux, and energy, which affects the quality and throughput of microelectronic and micromechanical device processing.

Innovation Solution

The system dynamically controls pulse timing parameters of the plasma generation source based on real-time measurement data from various devices, allowing for adjustments in pulse on-time, pulse off-time, and chamber pressure to maintain specified plasma properties during the process, using both feedforward and feedback control methods.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional hardware and processing techniques are used, then plasma processing can be performed, but plasma distribution uniformity and plasma density control are insufficient

Engineering Contradiction:
Improveplasma distribution uniformityVSAvoidcontrol system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent implements real-time feedback control by measuring actual plasma properties (density, ion flux, energy) during the pulsed plasma process and dynamically adjusting pulse timing parameters based on these measurements. This closed-loop feedback mechanism enables precise control of plasma distribution uniformity and density without requiring overly complex hardware modifications.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system dynamically adjusts pulse timing parameters (pulse width, pulse frequency, duty cycle) in real-time based on measured plasma conditions. This dynamic control approach allows the plasma processing system to adapt to changing substrate geometries and plasma conditions, maintaining uniform plasma distribution without fixed, complex hardware configurations.

Inventive Principle:
Principle #15Dynamics

2Manufacturing precision

If fixed plasma parameter settings are used, then the system architecture is simple, but plasma density and process performance are insufficient under certain conditions

Engineering Contradiction:
Improveplasma density controlVSAvoidparameter adjustment complexity
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

Real-time measurement of plasma density and other plasma properties feeds back to the control system, which automatically adjusts pulse timing parameters to maintain optimal plasma density. This eliminates the need for manual parameter tuning and complex operational procedures while achieving precise plasma density control.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The plasma processing system performs self-adjustment by automatically modifying pulse timing parameters based on real-time plasma measurements. The system self-optimizes plasma density and distribution without requiring external intervention or complex operational procedures, improving both control precision and ease of operation.

Inventive Principle:
Principle #25Self-service

3Reliability

If real-time pulse timing control is implemented, then plasma properties are precisely controlled, but system complexity increases

Engineering Contradiction:
Improveplasma property controlVSAvoidcontrol system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system uses feedback control where real-time measurements of plasma properties (density, ion flux, energy) are continuously monitored and used to adjust pulse timing parameters. This feedback mechanism ensures reliable plasma property control while keeping the control system architecture relatively simple through automated closed-loop control.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system controls plasma properties by dynamically changing pulse timing parameters (pulse width, frequency, duty cycle) in real-time based on measured plasma conditions. This parameter adjustment approach achieves reliable plasma control through software-based control rather than complex hardware modifications.

Inventive Principle:
Principle #35Parameter changes

4Manufacturing precision

If conventional plasma control methods are used, then the system is easy to operate, but controllability of plasma properties is challenging

Engineering Contradiction:
Improveplasma property controllabilityVSAvoidoperational complexity
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

Real-time feedback from plasma measurements enables automatic adjustment of pulse timing parameters, achieving precise plasma property controllability without requiring complex manual operations. The feedback loop handles the complexity of parameter tuning automatically.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system automatically adjusts plasma properties through self-service control mechanisms that modify pulse timing parameters based on real-time measurements. This eliminates the need for complex manual parameter adjustment while achieving high plasma property controllability.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise control of plasma density, ion flux, and energy, improving the uniformity and stability of plasma fields, thereby enhancing the quality and efficiency of substrate processing in plasma etching and deposition processes.

Implementation Method 1

Plasma processing systems generate plasma by supplying high frequency electrical power to gas mixtures in a plasma process chamber to ionize the gases in the plasma process chamber

Methodology Applied
Scientific EffectPlasma generation through ionization: Ionisation

Data Source

PatentUS12057293B2Methods for real-time pulse measurement and pulse timing adjustment to control plasma process performance
Publication Date: 2024.08.06 TOKYO ELECTRON LTD
  • US12057293B2 patent drawing
  • US12057293B2 patent drawing
  • US12057293B2 patent drawing

AI summary

Various embodiments of systems and methods are described herein for controlling a pulsed plasma. Pulse timing parameters (e.g., the pulse on-time and/or the pulse-off time) of the plasma generation source may be controlled based on the measurement data received from measurement device(s), to control the plasma exposure of the substrate during a sequence of dynamically controlled pulses within the plasma process chamber. In addition or alternatively, pulse timing parameters (e.g., the pulse on-time and/or the pulse-off time) can be applied to the source power, bias power, and/or both based on the measurement data received from measurement device(s), to control a plasma exposure of the substrate. The pulse timing changes may be made in a feedforward or feedback manner.