Plasma Processing Radical Source Chamber Thermal Plenum

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current plasma processing technologies face challenges in achieving precise control and uniformity in fabricating nanostructures at the atomic scale across large semiconductor wafers, particularly in reducing feature sizes and minimizing plasma-induced damage and instability in semiconductor fabrication.

Innovation Solution

A plasma processing system with a radical source chamber, a thermally conductive plenum, and a process chamber design that includes a substrate holder and gas outlet, where radicals are generated using an RF electrode and transported through openings in the plenum to chemically process the substrate, reducing ion bombardment and plasma-induced radiation damage while maintaining a stable processing environment through efficient heat dissipation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If plasma processing is used to fabricate nanostructures with precise atomic-scale control, then manufacturing precision is improved, but plasma-induced damage and instability increase

Engineering Contradiction:
Improveatomic-scale controlVSAvoidplasma-induced damage
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The system divides the processing chamber into two distinct zones: a radical source chamber where plasma is generated to produce radicals, and a processing chamber where substrates are treated. This segmentation allows the harmful plasma to be confined to the source chamber while only the beneficial radicals reach the substrates, reducing plasma-induced damage while maintaining precise atomic-scale control in the processing chamber.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system extracts only the desired radicals from the plasma environment and transports them through a differentially pumped aperture to the processing chamber. By taking out only the necessary reactive species while leaving the harmful plasma components behind, the system achieves precise manufacturing control without exposing substrates to damaging plasma conditions.

Inventive Principle:
Principle #2Taking out (Extraction)

2Productivity

If feature sizes are reduced to increase component packing density, then productivity is improved, but manufacturing precision and stability become more difficult to maintain

Engineering Contradiction:
Improvecomponent packing densityVSAvoidfeature size control
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The system creates a localized environment in the processing chamber where radical flux can be precisely controlled and optimized for each substrate position. By maintaining a stable, plasma-free processing environment with controlled radical delivery, the system achieves consistent atomic-scale precision even as feature sizes are reduced to increase component packing density.

Inventive Principle:
Principle #3Local quality

3Quantity of substance

If radicals are transported directly from plasma to substrate, then radical flux is improved, but radical loss and instability increase

Engineering Contradiction:
Improveradical fluxVSAvoidradical loss
Core Design Contradiction:
Quantity of substanceVSLoss of substance

Solution Approach 1:

The system introduces a differentially pumped aperture as an intermediary between the radical source chamber and the processing chamber. This intermediary structure enables efficient radical transport while maintaining differential pumping conditions that prevent radical loss and ensure stable radical flux delivery to the substrates.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system achieves enhanced radical flux to ion flux ratio, reduces plasma-induced damage, and maintains a stable processing environment, ensuring efficient and precise chemical processing of substrates with reduced radical loss and instability.

Implementation Method 1

an electrode coupled to a radio frequency (RF) power source, where the electrode is configured to generate radicals within the radical source chamber

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

an electrode coupled to a radio frequency (RF) power source

Methodology Applied
Scientific EffectRadio frequency heating: Dielectric Heating

Implementation Method 3

transporting the radicals to the substrate in a gas flow through openings in the walls of the plenum

Methodology Applied
Scientific EffectGas flow: Convection

Implementation Method 4

the plenum is made of a first thermal conductor, and where the walls of the plenum include openings for gas flow; process chamber walls including a second thermal conductor, where the process chamber walls of the process chamber are thermally coupled to the walls of the plenum

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS11521834B2Plasma processing systems and methods for chemical processing a substrate
Publication Date: 2022.12.06 TOKYO ELECTRON LTD
  • US11521834B2 patent drawing
  • US11521834B2 patent drawing
  • US11521834B2 patent drawing

AI summary

A plasma processing system includes a radical source chamber including a gas inlet, an electrode coupled to a radio frequency (RF) power source, where the electrode is configured to generate radicals within the radical source chamber, and an exit for radicals generated within the radical source chamber; a plenum attached to the exit of the radical source chamber, where the plenum is made of a first thermal conductor, and where the walls of the plenum include openings for gas flow; and a process chamber connected to the radical source chamber through the plenum. The process chamber includes a substrate holder disposed below the plenum; a gas outlet below the substrate holder; and process chamber walls including a second thermal conductor, where the process chamber walls of the process chamber are thermally coupled to the walls of the plenum.