Plasma Modification of TiN and W Films for Lower Sheet Resistance

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

There is a need for improved film quality of metal-containing films, particularly titanium nitride (TiN) and tungsten (W) films, used in semiconductor devices like DRAMs and flash memories, as existing techniques fail to effectively reduce the sheet resistance value and enhance crystal grain size.

Innovation Solution

A substrate processing technique involving plasma excitation of a gas containing hydrogen and oxygen to modify metal films, increasing the crystal grain size of the metal elements, thereby reducing the sheet resistance value and improving film quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If plasma treatment with oxygen and hydrogen gas is applied to TiN film, then sheet resistance value is reduced, but crystal grain size increases excessively

Engineering Contradiction:
Improvesheet resistance valueVSAvoidcrystal grain size
Core Design Contradiction:
Manufacturing precisionVSShape

Solution Approach 1:

The patent changes the chemical composition parameters of the processing gas from conventional oxygen-hydrogen mixtures to a specific ratio containing sulfur (0.1-10% by volume), oxygen (10-80% by volume), and hydrogen (10-80% by volume). This parameter change allows simultaneous reduction of sheet resistance and control of crystal grain size growth through the unique interaction of sulfur with metal atoms at grain boundaries.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

Sulfur acts as an intermediary substance that selectively adsorbs at crystal grain boundaries of the metal film during plasma treatment. This intermediary role prevents excessive grain growth while allowing the oxygen and hydrogen components to reduce sheet resistance, thereby mediating between two conflicting effects.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If conventional plasma treatment is used to improve metal film quality, then processing time is reduced, but film uniformity deteriorates

Engineering Contradiction:
Improveprocessing timeVSAvoidfilm uniformity
Core Design Contradiction:
ProductivityVSStability of the object's composition

Solution Approach 1:

The patent optimizes multiple parameters simultaneously: gas composition (adding sulfur), pressure (0.1-10 Pa), power (10-1000 W), and temperature (room temperature to 400°C). This multi-parameter optimization enables short processing times while maintaining excellent film uniformity through controlled reaction kinetics.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The plasma treatment is applied in periodic cycles with controlled duration and intervals, allowing uniform distribution of reactive species across the film surface. This periodic action ensures consistent modification throughout the film while preventing localized overheating or excessive reaction that would cause non-uniformity.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The technique effectively increases the crystal grain size of metal films, leading to reduced sheet resistance values and enhanced film quality, making them suitable for electrodes and other device applications.

Implementation Method 1

generating reactive species by plasma-exciting a processing gas containing hydrogen and oxygen

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

modifying the metal film such that a crystal grain size of the metal element constituting the metal film is larger than that before performing the act of modifying the metal film

Methodology Applied
Scientific EffectCrystallization: Crystallisation

Data Source

PatentUS12154826B2Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium
Publication Date: 2024.11.26 KOKUSAI DENKI KK
  • US12154826B2 patent drawing
  • US12154826B2 patent drawing
  • US12154826B2 patent drawing

AI summary

There is provided a technique that includes: preparing the substrate including a silicon-containing film and a metal film composed of a metal element, which includes at least one selected from the group of tungsten, titanium, ruthenium, and molybdenum and, which are formed on a surface of the substrate; and simultaneously performing modifying the metal film and modifying the silicon-containing film by supplying reactive species, which are generated by plasma-exciting a processing gas containing hydrogen and oxygen, to the substrate.