Plasma Torch Baffle Suppresses Vortex Shedding

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Plasma-based spectrometry instruments face issues with ion current noise and ambient gas entrainment due to annular vortex shedding, which affect signal precision and introduce unwanted species into the plasma, leading to interference in elemental analysis.

Innovation Solution

A plasma source configuration with a baffle positioned between the torch exit and the chamber wall, effectively suppressing annular vortex shedding by maintaining a specific axial distance and aperture size, thereby reducing noise and ambient gas entrainment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If plasma is discharged into chamber without baffle, then ambient gas entrainment occurs causing ion current noise, but adding baffle increases device complexity

Engineering Contradiction:
Improvesignal precisionVSAvoidplasma source structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A baffle is introduced as an intermediary component between the plasma torch exit and the chamber wall. The baffle includes an aperture that allows plasma to pass through while blocking ambient gas from being drawn into the plasma stream, thereby reducing ion current noise without completely obstructing the plasma flow path.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The plasma discharge path is segmented into two zones: an upstream region where plasma is generated and discharged, and a downstream region near the chamber wall. The baffle creates a physical separation that prevents ambient gas from the downstream region from mixing with the plasma in the upstream region, while still allowing controlled interaction through the aperture.

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If baffle aperture is small, then ambient gas entrainment is reduced, but plasma flow is restricted affecting analysis efficiency

Engineering Contradiction:
Improveambient gas entrainmentVSAvoidanalysis efficiency
Core Design Contradiction:
Object-affected harmful factorsVSProductivity

Solution Approach 1:

The baffle aperture dimensions are optimized to specific parameter ranges that balance two competing requirements: the aperture is small enough to block ambient gas entrainment but large enough to maintain adequate plasma flow. The aperture size is selected based on experimental optimization of plasma stability and reduction of ion current noise while preserving analysis throughput.

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If baffle is positioned close to chamber wall, then ambient gas blockage is improved, but plasma stability deteriorates due to excessive confinement

Engineering Contradiction:
Improveambient gas blockageVSAvoidplasma stability
Core Design Contradiction:
Object-affected harmful factorsVSStability of the object's composition

Solution Approach 1:

Instead of positioning the baffle directly against the chamber wall (zero-dimensional contact), the baffle is positioned at a specific axial distance from the wall, creating a gap that allows plasma to interact with the chamber environment in a controlled manner. This axial positioning in another dimension enables the baffle to block ambient gas while avoiding excessive confinement that would destabilize the plasma.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly reduces detector noise and ambient gas entrainment, enhancing the precision of elemental analysis by eliminating audio frequency tones and minimizing the presence of undesirable species in the plasma, thus improving instrument performance and accuracy.

Implementation Method 1

The phenomenon has been postulated to be caused by a hydrodynamic effect occurring at the plasma torch exit (the end of the outer tube) where the hot plasma exits into the cool ambient gas (e.g., air). This effect is commonly known as annular vortex shedding, which has been postulated to be caused by the Kelvin-Hemholtz instability.

Methodology Applied
Scientific EffectAnnular vortex shedding: Kármán Vortex Street

Implementation Method 2

This effect is commonly known as annular vortex shedding, which has been postulated to be caused by the Kelvin-Hemholtz instability.

Methodology Applied
Scientific EffectKelvin-Helmholtz instability: Kelvin-Helmholtz Instability

Implementation Method 3

The instrument may be, for example, a spectrometer that includes a plasma-generating device (plasma source)... The plasma source often is configured as a flow-through torch having two or more concentric tubes. Typically, a plasma-forming gas such as argon or nitrogen flows through an outer tube and is energized into a plasma by an appropriate energy source

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 4

In the plasma, unbound electrons repeatedly collide with the sample atoms or ions. As a result of this process, the atoms or ions emit electromagnetic radiation (light) at wavelengths characteristic of their elemental identities.

Methodology Applied
Scientific EffectElectron collision:

Implementation Method 5

The plasma is typically inductively coupled plasma (ICP) or microwave induced plasma (MIP).

Methodology Applied
Scientific EffectInductively coupled plasma:

Implementation Method 6

The plasma is typically inductively coupled plasma (ICP) or microwave induced plasma (MIP).

Methodology Applied
Scientific EffectMicrowave induced plasma: Microwave Radiation

Data Source

PatentEP3021645B1Reduction of ambient gas entrainment and ion current noise in plasma based spectrometry
Publication Date: 2017.12.20 AGILENT TECHNOLOGIES INC
  • EP3021645B1 patent drawingFigure 1
  • EP3021645B1 patent drawingFigure 2
  • EP3021645B1 patent drawingFigure 3A~3B

AI summary

In a plasma source (200) configured for producing sample atoms for analysis, such as by optical emission spectrometry or mass spectrometry, a plasma torch (204) includes a torch exit (216) in a chamber (212). A baffle (276) is positioned between the torch exit (216) and an opposing boundary. The baffle (276) may be positioned and configured to suppress or eliminate vortex shedding in the chamber (212).