Plasma Torch Nitrogen Gas Injection for Lower Elemental Background

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Background signals and interferences often reduce the ability to detect certain elemental species at low levels in elemental analysis.

Innovation Solution

Introducing a gas comprising a nitrogen center, such as nitrogen gas, ammonia, or nitrous oxide, into the sample introduction device or directly into the plasma torch to reduce background signals and interfering species.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a gas comprising a nitrogen center is introduced into the sample introduction device or plasma torch, then background signals and interfering species are reduced, but device complexity increases due to additional gas flow systems

Engineering Contradiction:
Improvedetection limitVSAvoidgas flow system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A gas comprising a nitrogen center is introduced as an intermediary substance into the sample introduction device or plasma torch to reduce background signals and interfering species. The nitrogen-containing gas acts as a mediator that modifies the plasma environment to suppress interference formation, thereby improving detection limits for elemental species without requiring fundamental changes to the instrument architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The composition of the plasma gas is modified by introducing a gas comprising a nitrogen center, changing the chemical parameters of the plasma environment. This parameter change affects the formation of background signals and interfering species, allowing for improved measurement precision. The nitrogen-containing gas alters the plasma chemistry to reduce polyatomic ion interferences and background noise.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If a gas comprising a nitrogen center is introduced into the sample introduction device or plasma torch, then background equivalent concentration is improved, but the operational complexity increases due to multiple separate gas flows

Engineering Contradiction:
Improvebackground equivalent concentrationVSAvoidgas flow management
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The gas comprising a nitrogen center serves multiple functions simultaneously: it acts as a plasma modifier to reduce background signals, functions as an interference suppressor, and contributes to plasma stabilization. This multi-functionality consolidates several operational requirements into a single gas flow system, reducing the overall operational complexity despite the advanced functionality provided.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the background equivalent concentration for certain elemental species, leading to enhanced detection limits and reduced background noise.

Implementation Method 1

use a gas comprising a nitrogen center... to reduce background signals and/or the presence of interfering species during analysis

Methodology Applied
Scientific EffectChemical reactions:

Data Source

PatentEP3949694B1Devices and methods to improve background equivalent concentrations of elemental species
Publication Date: 2025.04.30 PERKINELMER SCIENTIFIC CANADA ULC
  • EP3949694B1 patent drawingFigure 1A~1B
  • EP3949694B1 patent drawingFigure 1C~2A
  • EP3949694B1 patent drawingFigure 2B~2C

AI summary

Methods and systems that can use a gas comprising a nitrogen center that is introduced upstream of a plasma sustained in a torch are described. In some configurations, the gas comprising the nitrogen center can be introduced as a gas upstream of the plasma and through a sample introduction device. Mass spectrometers and optical emission systems that can use the gas comprising the nitrogen center are also described.