Surface Plasmon Fluorescence Detection Using Chip Mark Positioning
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Solution Overview
Problem
Existing surface-plasmon enhanced fluorescence measurement methods face challenges in accurately positioning analysis chips without increasing manufacturing costs, as they often require additional light sources and wavelength filters.
Innovation Solution
A surface-plasmon enhanced fluorescence measurement method and device that utilize a mark on the analysis chip to detect the position through plasmon scattering light, allowing for accurate positioning without the need for additional light sources or filters, using a configuration where the mark is disposed outside the capturing region and is designed to change the scattered state of plasmon scattering light for detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional light sources and wavelength filters are used for positioning, then positioning accuracy is improved, but manufacturing costs and device complexity increase
Solution Approach 1:
The excitation light source serves dual functions: both generating surface plasmon resonance for fluorescence detection and illuminating the mark for positioning. The scattering light detection system also serves dual purposes by detecting both the mark position and monitoring excitation light delivery to the metal film
Solution Approach 2:
Instead of using a separate positioning light source, the system uses the existing excitation light to illuminate a mark on the analysis chip. The mark reflects or scatters this light, creating an optical copy or signal that indicates position without requiring additional light-generating components
2Ease of operation
If a separate illumination light source is added for positioning, then positioning capability is improved, but manufacturing costs increase
Solution Approach 1:
The excitation light source performs multiple functions including fluorescence excitation and mark illumination for positioning, eliminating the need for separate positioning light sources and reducing manufacturing costs
Solution Approach 2:
The system uses its own excitation light to illuminate the mark and detect position, rather than requiring external positioning equipment. The scattering light detection system simultaneously serves both positioning and excitation light monitoring functions
3Adaptability or versatility
If the analysis chip is shifted in position, then positioning flexibility is improved, but detection accuracy deteriorates
Solution Approach 1:
The scattering light detection system provides real-time feedback on the position of the mark relative to the excitation light spot. This feedback enables the system to detect and correct positioning errors, maintaining detection accuracy even when the analysis chip is shifted or repositioned
Solution Approach 2:
The mark is pre-positioned on the analysis chip at a known location. By detecting the mark's position before fluorescence measurement, the system can preliminarily adjust or verify the alignment, ensuring accurate detection even if the chip shifts during handling
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and cost-effective positioning of analysis chips, ensuring highly sensitive and accurate detection of detection-target substances while maintaining low manufacturing costs.
Implementation Method 1
utilize a mark 50 on the analysis chip 10 to detect the position through plasmon scattering light
Implementation Method 2
detect the scattered state of plasmon scattering light
Implementation Method 3
Irradiation of the metal film with excitation light through the prism at an angle at which surface plasmon resonance occurs can generate localized light (enhanced electric field) on the surface of the metal film
Implementation Method 4
This localized light excites a fluorescent substance used for labeling the detection-target substance captured on the metal film, therefore making it possible to detect the presence or amount of the detection-target substance through detection of the fluorescence emitted from the fluorescent substance
Data Source
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AI summary
First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattered light emitted from the surrounding region, is disposed in a chip holder. Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected.