Platinum Patterning via Aluminum Alloying and Selective Etching

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Solution Overview

Problem

Current methods for patterning platinum in microelectronic devices face challenges due to its inertness, leading to contamination risks and difficulties in mass production, especially for thick films, which are essential for harsh environment sensors and bio-MEMS devices.

Innovation Solution

A method involving the deposition of a platinum layer on a substrate, followed by forming a patterned photoresist layer and alloying with a sacrificial aluminum layer, which is then etched away to create a patterned platinum layer, using a combination of wet etching processes and annealing in a nitrogen atmosphere to form a platinum-aluminum alloy, allowing for selective removal and pattern formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If platinum is used for its inertness and chemical stability, then reliability is improved, but manufacturing precision deteriorates due to difficulty in patterning

Engineering Contradiction:
Improvechemical stabilityVSAvoidpatterning precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

A sacrificial aluminum layer is deposited on the platinum layer before patterning. This preliminary action enables selective etching of the aluminum layer to define patterns in the underlying platinum layer, solving the patterning difficulty caused by platinum's inertness

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The sacrificial aluminum layer acts as an intermediary material that facilitates pattern transfer to the platinum layer. The aluminum layer is selectively etched away, leaving the desired pattern in the platinum while the platinum itself remains unaffected by the etching process

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If conventional platinum patterning methods are used, then manufacturing simplicity is maintained, but harmful factors increase due to contamination risks

Engineering Contradiction:
Improveprocess simplicityVSAvoidcontamination
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The sacrificial aluminum layer serves as a mediator that protects the platinum from direct exposure to etching chemicals and processing steps. This intermediary approach eliminates contamination risks while maintaining process simplicity

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The sacrificial aluminum layer is a temporary, disposable material that is intentionally deposited and then completely removed after serving its patterning function. This disposable approach prevents contamination of the platinum layer while enabling precise pattern formation

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Reliability

If thick platinum films are used for harsh environment sensors, then reliability is improved, but device complexity increases due to patterning difficulties

Engineering Contradiction:
Improvecorrosion resistanceVSAvoidpatterning process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The sacrificial aluminum layer is deposited and patterned before the final platinum structure is completed. This preliminary patterning action simplifies the overall process for creating thick platinum films by avoiding direct manipulation of the inert platinum material

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The aluminum layer mediates the patterning process for thick platinum films, enabling complex patterns to be formed without directly processing the platinum. This intermediary approach reduces device complexity while maintaining the reliability benefits of thick platinum films

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables reliable and controlled patterning of platinum, overcoming contamination issues and achieving high process control, allowing for the production of patterned platinum layers suitable for microelectronic devices and sensors with improved feature sizes and aspect ratios.

Implementation Method 1

A first platinum layer and a second aluminum layer are alloyed together

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 2

The patterned photoresist layer is removed, exposing the underlying platinum and aluminum layers

Methodology Applied
Scientific EffectWet etching:

Implementation Method 3

The sacrificial aluminum layer and platinum-aluminum alloy are selectively removed, leaving the patterned platinum layer

Methodology Applied
Scientific EffectSelective wet etching:

Implementation Method 4

A first platinum layer is deposited on a substrate

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Implementation Method 5

A second aluminum layer is deposited over the platinum layer

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Data Source

PatentUS20230253211A1Patterning platinum by alloying and etching platinum alloy
Publication Date: 2023.08.10 TEXAS INSTRUMENTS INC
  • US20230253211A1 patent drawing
  • US20230253211A1 patent drawing
  • US20230253211A1 patent drawing

AI summary

There is provided a method of patterning platinum on a substrate. A platinum layer is deposited on the substrate, and a patterned photoresist layer is formed over the platinum layer leaving partly exposed regions of the platinum layer. An aluminum layer is deposited over the partly exposed regions of the platinum layer. An alloy is formed of aluminum with platinum from the partly exposed regions. The platinum aluminum alloy is etched away leaving a remaining portion of the platinum layer to form a patterned platinum layer on the substrate. In an embodiment, a thin hard mask layer is deposited on the platinum layer on the semiconductor substrate before the patterned photoresist layer is formed.