PLD Defect Isolation Using Adaptive Test Configurations
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Solution Overview
Problem
The analysis of defective programmable logic devices (PLDs) is time-consuming and expensive, as existing methods lack efficient fault isolation techniques to identify recurring defects for design or manufacturing process modifications.
Innovation Solution
A method is introduced to automatically isolate defects in PLDs by creating a sequence of configurations that route data through programmable logic and interconnect circuits using snake chain patterns, with each configuration generated based on output data from prior tests, allowing for sequential defect isolation and identification of bridging faults and other defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual analysis methods are used to identify defects in PLDs, then detailed defect identification can be achieved, but the process becomes time-consuming and expensive
Solution Approach 1:
The patent segments the PLD into multiple regions and uses a sequence of configurations to systematically test different portions of the device. Each configuration isolates specific regions, allowing defects to be located through progressive division of the testing scope, thereby reducing overall analysis time while maintaining precision.
Solution Approach 2:
The patent employs preliminary actions by pre-configuring multiple test configurations in advance and using output data from prior configurations to determine subsequent test paths. This allows the testing process to be more efficient and targeted, reducing the time required for defect identification.
2Reliability
If comprehensive testing of all PLD configurations is performed, then all defects can be identified, but the complexity and cost of the testing process increases
Solution Approach 1:
The patent implements dynamic testing where the sequence of configurations is adaptively determined based on output data from prior configurations. This dynamic approach allows the testing process to focus on relevant areas, reducing overall complexity while maintaining comprehensive defect detection through intelligent adaptation rather than exhaustive static testing.
Solution Approach 2:
The patent uses feedback mechanisms where output data from each configuration assessment informs the selection and generation of subsequent configurations. This feedback loop enables the system to automatically adjust the testing sequence based on detected anomalies, achieving comprehensive defect identification with reduced complexity by avoiding unnecessary tests.
3Productivity
If automated testing is implemented to reduce manual analysis time, then testing speed increases, but the complexity of the automated system increases
Solution Approach 1:
The patent employs a sequence generator that can generate multiple different configurations using the same basic hardware infrastructure. This multi-functional approach allows a single automated system to perform various testing functions through software-controlled configuration changes, increasing productivity while minimizing the need for additional complex hardware components.
Data Source
AI summary
A defect is automatically isolated in an integrated circuit device having programmable logic and interconnect circuits. A sequence of configurations is created to route data in a pattern through the programmable logic and interconnect circuits. Each configuration within the sequence is determined (e.g., generated or selected from a plurality of pre-generated configurations) as a function of output data from a prior configuration in the sequence. For each configuration in the sequence, the programmable logic and interconnect circuits are configured with the configuration and an automatic test instrument routes data in the pattern through the programmable logic and interconnect circuits. For each configuration in the sequence, the output data from the programmable logic and interconnect circuits is assessed. For each configuration in the sequence, the assessed output data isolates the defect to a portion of the pattern for the configuration that is within the portion for a prior configuration in the sequence.