Unified Error Analysis Platform for PLM and MOM Data Integration

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Solution Overview

Problem

Current product lifecycle management (PLM), manufacturing operations management (MOM), and quality management systems (QMS) face challenges in efficiently analyzing product deficiencies due to the separation of digital and physical part data, leading to incomplete error analysis and increased time and effort in identifying root causes.

Innovation Solution

A data processing system that integrates lifecycle and manufacturing operations information across PLM and MOM/QMS systems, using a graphical user interface (GUI) to display and analyze data from both domains, enabling a centralized approach for error analysis and root cause identification by linking non-conformance data across the product lifecycle.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If lifecycle information and manufacturing operations information are stored in separate databases (PLM and MOM/QMS systems), then data security and system independence are maintained, but error analysis completeness and root cause identification efficiency deteriorate

Engineering Contradiction:
Improvedata security and system independenceVSAvoiderror analysis completeness
Core Design Contradiction:
ReliabilityVSLoss of information

Solution Approach 1:

The patent introduces a data integration layer that acts as an intermediary between the PLM and MOM/QMS databases. This layer retrieves and correlates lifecycle information from the PLM database with manufacturing operations information from the MOM/QMS database, enabling comprehensive error analysis without compromising the independence and security of the underlying systems. The intermediary facilitates information flow while maintaining system boundaries.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system creates a universal error analysis platform that can access and process data from multiple separate databases (PLM and MOM/QMS). This multi-functional approach allows the error analysis system to utilize diverse data sources simultaneously, achieving complete error analysis without requiring physical consolidation of the source systems.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Device complexity

If lifecycle information and manufacturing operations information are stored in separate databases, then system complexity and integration requirements are reduced, but time and effort required for identifying root causes increases

Engineering Contradiction:
Improvesystem integration complexityVSAvoidroot cause identification time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The system performs preliminary data retrieval and correlation by establishing connection protocols and data mapping between PLM and MOM/QMS databases in advance. When an error analysis is needed, the integrated system can quickly access and correlate the necessary information without ad-hoc integration efforts, significantly reducing the time required for root cause identification.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The error analysis system implements feedback mechanisms that automatically retrieve relevant information from both PLM and MOM/QMS databases based on error indicators. The system correlates data from both sources and provides feedback loops that refine the analysis, enabling rapid root cause identification without manual data gathering from separate systems.

Inventive Principle:
Principle #23Feedback

3Ease of manufacture

If digital and physical part data are analyzed separately, then data management simplicity is maintained, but product deficiency analysis depth and efficiency deteriorates

Engineering Contradiction:
Improvedata management simplicityVSAvoiderror analysis efficiency
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The patent merges the analysis of digital part data from the PLM database with physical part data from the MOM/QMS database into a unified error analysis process. The system correlates lifecycle information with manufacturing operations information, enabling comprehensive analysis of product deficiencies by combining insights from both digital and physical domains while maintaining the simplicity of separate data management systems.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10963894B2Facilitating an error analysis of a product deficiency system and method
Publication Date: 2021.03.30 SIEMENS HEALTHCARE SOFTWARE GMBH
  • US10963894B2 patent drawing
  • US10963894B2 patent drawing
  • US10963894B2 patent drawing

AI summary

Systems and methods are provided that facilitating an error analysis of a product deficiency. The system may comprise a processor configured to: store lifecycle information related to a lifecycle of the product in a lifecycle database; store manufacturing operations information related to manufacturing operations of the product in a manufacturing operations database; store further lifecycle information related to lifecycle issues and/or non-conformances of the product in the lifecycle database; store further manufacturing operations information related to concerns and/or complaints of the product in the manufacturing operations database; store first reference information related to the further lifecycle information from the lifecycle database in the manufacturing operations database; generate a graphical user interface (GUI) through a display device that enables the manufacturing operations information stored in the manufacturing operations database; and cause the manufacturing operations information, the further manufacturing operations information, and the further lifecycle information to be displayed in the GUI.