Pluggable Transceivers Embedded Network Testing Logic
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Solution Overview
Problem
Existing communication networks face operational complexity and cost inefficiencies due to the lack of unified test functions across different network equipment vendors, leading to incomplete coverage and increased expenses for testing Ethernet services, especially in constrained locations where external test equipment cannot be installed.
Innovation Solution
The integration of programmable logic arrays with test logic modules into pluggable transceivers allows for embedded Layer 2, Layer 3, and higher network testing functionalities, enabling centralized network measurements and unified test management through a mediation subsystem and central test server, eliminating the need for external test devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If external Network Interface Devices (NIDs) are inserted to provide test functions, then testing capability is improved, but device complexity and cost increase
Solution Approach 1:
The patent merges test functionality with existing network equipment by integrating test logic into the pluggable transceiver module itself. The transceiver combines both data communication and test measurement functions in a single unified device, eliminating the need for separate external NIDs and reducing overall system complexity while maintaining comprehensive testing capability.
Solution Approach 2:
The pluggable transceiver is designed with multi-functionality, serving both as a standard data communication interface and as a test measurement device. It can perform Layer 2 and Layer 3 testing functions while maintaining its primary networking function, allowing a single device to replace multiple dedicated devices.
2Reliability
If external NIDs are added to provide test functions, then testing coverage is improved, but loss of energy and resources increase
Solution Approach 1:
By combining test functions within the existing transceiver module rather than adding separate external devices, the patent eliminates redundant hardware that would consume additional energy. The integrated approach ensures testing coverage without the energy overhead of multiple independent devices.
3Reliability
If NIDs are installed in constrained locations, then testing capability is improved, but ease of operation deteriorates
Solution Approach 1:
The pluggable transceiver provides universal functionality that works consistently across all network locations including constrained environments. Since the test capability is built into the standard transceiver interface, it operates with the same ease in tower locations, constrained spaces, or standard rack installations without requiring special handling or configuration.
4Adaptability or versatility
If heterogeneous NEs from different manufacturers are used, then adaptability is improved, but device complexity increases
Solution Approach 1:
The patent implements a universal test interface through the pluggable transceiver that follows standardized specifications, allowing the same test device to operate with network elements from different manufacturers. This standardization approach maintains adaptability to various vendor equipment while reducing operational complexity through consistent interfaces and procedures.
Data Source
AI summary
The disclosure relates to test-capable pluggable transceivers and network systems and methods using such transceivers. A central test server generates a test request and communicates to a mediation sub-system, which uses a common management protocol to communicate with a plurality of transceivers in the network. The mediation sub-system translates the test request into sub-tests and generates sequences of test-control commands for executing by specific transceivers to configure test logic deployed within the transceivers for testing designated network services, to generate test frames, and/or to process received frames to collect test results.