Power Management IC Electric Field Shield for High Voltage Isolation
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Solution Overview
Problem
High operating voltages in Power Management Integrated Circuits (PMICs) lead to electric field generation between metal interconnections and device isolation layers, resulting in insufficient breakdown voltage and parasite currents, compromising the stability of PMIC operations.
Innovation Solution
Incorporating an electric field shield between the metal interconnection and the device isolation layer to prevent induced currents and ensure higher breakdown voltages, enhancing the electrical isolation between High-Side and Low-Side regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If high operating voltage is applied to the PMIC, then the power management capability is improved, but electric field generation between metal interconnection and device isolation layer causes insufficient breakdown voltage and parasite current
Solution Approach 1:
An electric field shield is introduced as an intermediary component between the metal interconnection and the device isolation layer. This shield structure intercepts and redirects the electric field lines, preventing direct field penetration into the isolation layer, thereby eliminating the generation of parasite current while allowing the high operating voltage to be maintained.
2Power
If high operating voltage is applied to the PMIC, then the power management capability is improved, but electric field generation causes insufficient breakdown voltage
Solution Approach 1:
The electric field shield converts the harmful electric field effect into a beneficial shielding effect. By strategically positioning the shield, the electric field is redirected along a controlled path that benefits the overall device performance while preventing harmful interactions with the isolation layer and sensitive regions.
3Ease of operation
If metal interconnection crosses over HS and LS regions, then electrical connection is improved, but parasite current and breakdown voltage issues occur
Solution Approach 1:
The electric field shield acts as a mediator between the metal interconnection and the underlying isolation layer. It allows the interconnection to maintain its routing flexibility while blocking the harmful electric field interaction, thus preventing parasite current generation without compromising the electrical connection functionality.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The electric field shield structure significantly widens the operating voltage range, ensuring stable PMIC operations by preventing parasite currents and maintaining a breakdown voltage at least 10% higher than the operating voltage, thereby improving operational reliability.
Implementation Method 1
at least one electric field shield between the metal interconnection and the device isolation layer
Data Source
AI summary
A Power Management Integrated Circuit (PMIC) that includes a substrate, a high-side (HS) region on the substrate, a low-side (LS) region spaced from the first region, a device isolation layer interposed between the HS region and the LS region, a metal interconnection connected to the HS region across the device isolation layer and configured to permit a high-voltage current to flow in the HS region, and at least one electric field shield between the metal interconnection and the device isolation layer. Since the electric field shield is disposed under the metal interconnection, a sufficient breakdown voltage can be ensured for the HS region and the LS region.