Memory Module PMIC Voltage Trimming for DRAM Yield
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Solution Overview
Problem
The challenge lies in implementing high-capacity DRAM memory devices within a limited area due to the difficulty in reducing the size of DRAM memory cells, which affects the performance and yield of memory modules.
Innovation Solution
A memory module comprising a plurality of semiconductor memory devices, a power management integrated circuit (PMIC), and a control device, where the PMIC generates and adjusts the power supply voltage, tests the memory devices, and stores a trimming control code for optimal operation, enhancing performance and yield.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If DRAM memory cell size is reduced to increase capacity within limited area, then storage capacity is improved, but manufacturing precision and reliability deteriorate due to difficulty in reducing cell size
Solution Approach 1:
The patent changes the parameter of power supply voltage to optimize memory device operation. By adjusting voltage levels through trimming control codes, the system compensates for manufacturing variations without requiring further reduction of cell size, thus maintaining reliability while achieving high capacity through multiple devices per module.
Solution Approach 2:
The patent divides the memory system into multiple semiconductor memory devices mounted on a circuit board, with each device being a separate unit. This segmentation allows the system to achieve high total capacity by combining multiple devices rather than relying on a single large-capacity device with reduced cell size.
2Reliability
If power supply voltage level is increased to improve signal integrity and reliability, then reliability is improved, but power consumption increases
Solution Approach 1:
The patent implements dynamic voltage adjustment by allowing the PMIC to modify power supply voltage levels based on operating conditions and test results. The trimming control code enables the system to optimize voltage dynamically, using higher voltage only when necessary for reliability while consuming less power during normal operation.
Solution Approach 2:
The patent changes the power supply voltage parameter to an adjustable range rather than a fixed value. By storing trimming control codes that define optimal voltage levels, the system can adapt voltage parameters to balance reliability requirements with power consumption constraints.
3Productivity
If trimming control code is stored in PMIC to optimize voltage levels, then performance and yield are improved, but device complexity increases
Solution Approach 1:
The patent performs preliminary testing and voltage optimization during the manufacturing process. The PMIC stores trimming control codes determined during production testing, so that the optimal voltage parameters are established beforehand. This preliminary action improves yield by compensating for manufacturing variations before the devices reach the customer.
4Quantity of substance
If multiple semiconductor memory devices are mounted on circuit board to achieve high capacity, then storage capacity is improved, but area occupied increases
Solution Approach 1:
The patent merges multiple semiconductor memory devices into a single memory module assembly mounted on one circuit board. By combining devices and sharing common control logic and power management infrastructure, the system achieves high total capacity while occupying less area than dispersed individual devices would require.
Data Source
AI summary
A memory module includes semiconductor memory devices, a power management integrated circuit (PMIC), and a control device. The semiconductor memory devices, mounted on a circuit board, operate based on a power supply voltage. The PMIC, mounted on the circuit board, generates the power supply voltage, provides the power supply voltage to the semiconductor memory devices, and stores a trimming control code associated with a minimum level of the power supply voltage when the semiconductor memory devices operate normally in a test mode. During the test mode, the PMIC adjusts a level of the power supply voltage, tests the semiconductor memory devices using the adjusted power supply voltage, and stores the trimming control code based on a result of the test. The control device controls the PMIC based on a first control signal received from an external device.