Pogo Pin with Conductive Coil Spring for High-Current EMI Control
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Solution Overview
Problem
Existing test pins suffer from wear, require frequent replacement, and provide unreliable test results due to insufficient electrical performance and susceptibility to electromagnetic interference, especially when testing high-current devices like power semiconductors.
Innovation Solution
A test pin design featuring a pogo pin surrounded by a conductive coil spring, which enhances current carrying capacity, reduces electromagnetic interference, and provides self-cleaning capabilities through a rotational scrub mechanism.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If a conventional test pin is used, then the structure is simple, but the current carrying capability is insufficient and self-inductance is high
Solution Approach 1:
The patent implements a nested structure where a pogo pin is placed inside a coil spring, both surrounded by an outer housing. This nesting arrangement allows multiple conductive elements to occupy the same spatial envelope, increasing current carrying capability and reducing self-inductance without significantly increasing the overall footprint of the test pin assembly.
Solution Approach 2:
The patent combines multiple conductive elements (pogo pin and coil spring) into a single test pin assembly that functions as an integrated electrical contact. This merging of multiple conductive paths into one unified structure increases the effective current carrying capability while maintaining a compact form factor.
2Reliability
If a conventional test pin is used, then the manufacturing is simple, but the test reliability is insufficient due to electromagnetic interference
Solution Approach 1:
The nested arrangement of the pogo pin within the coil spring, both enclosed in an outer housing, creates a shielded structure that protects against electromagnetic interference. This nested configuration allows the inner conductive elements to be protected by outer conductive shields, improving test reliability without requiring complex external shielding systems.
Solution Approach 2:
The patent converts the potentially harmful effect of electromagnetic interference into a beneficial shielding effect by using conductive materials in a nested configuration. The outer housing and coil spring act as electromagnetic shields, converting what would be interference into protective shielding that enhances test reliability.
3Duration of action of stationary object
If a conventional test pin is used, then the structure is simple, but the test pin suffers from wear and requires frequent replacement
Solution Approach 1:
The nested structure with the pogo pin inside the coil spring, both within an outer housing, creates a protected environment for the contact elements. This nesting provides mechanical protection and reduces wear on the contact surfaces, extending the service life of the test pin without requiring complex protective mechanisms.
Solution Approach 2:
The coil spring in the nested structure acts as a cushioning element that absorbs mechanical stress and wear before it reaches the pogo pin contact surface. This prior cushioning protects the critical contact elements from wear, extending the operational life of the test pin.
4Power
If a conventional test pin is used, then the structure is simple, but the electrical performance is insufficient for high-frequency applications
Solution Approach 1:
The nested configuration of conductive elements within an enclosed housing creates a controlled electrical environment that reduces parasitic inductance and electromagnetic interference. This nesting arrangement improves electrical performance for high-frequency applications by minimizing unwanted electrical effects without requiring complex external circuitry.
Solution Approach 2:
The patent merges multiple conductive paths (pogo pin and coil spring) into a single integrated assembly, creating multiple parallel current paths that reduce overall resistance and inductance. This merging of conductive elements improves electrical performance for high-frequency and high-current applications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design allows for higher current carrying capability, reduced self-inductance, and improved test reliability with enhanced electromagnetic interference protection, particularly suitable for high-frequency and high-current applications.
Implementation Method 1
The test pin comprises an at least partially electrically conductive pogo pin and an at least partially electrically conductive coil spring surrounding the pogo pin at least over a major portion of a length of the pogo pin
Implementation Method 2
the test pin comprising an at least partially electrically conductive pogo pin and an at least partially electrically conductive coil spring surrounding the pogo pin
Data Source
AI summary
A test pin for a test device and a test device including a test pin is disclosed. One example comprises a test pin for a test device for electrically contacting a device under test to be tested, the test pin comprising an at least partially electrically conductive pogo pin, and an at least partially electrically conductive coil spring surrounding the pogo pin at least over a major portion of a length of the pogo pin.