Pogo Pin Test Support Module for Flexible DUT Signal Routing

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Solution Overview

Problem

Existing testing systems using pogo blocks are limited by high dependence on specific load boards, leading to high costs, poor signal performance, and vulnerability to temperature extremes due to electronic components being integrated within the load board.

Innovation Solution

A test support module with pogo pins and electronic components on a separate printed circuit board, allowing for universal use across different load boards, reducing cable connections, and positioning components outside the load board to protect them from temperature extremes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If electronic components are integrated within the load board, then the testing system can be compact, but the components are vulnerable to temperature extremes and the load board space is limited

Engineering Contradiction:
Improvetesting system compactnessVSAvoidcomponent reliability under temperature extremes
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The testing system is divided into separate functional modules: the load board for mechanical support and electrical connection, and a separate circuit board for electronic components. This segmentation allows each component to be optimized independently - the load board can be designed for mechanical robustness while the circuit board can be designed for electronic performance and temperature protection.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The electronic components are extracted from the load board and placed on a separate circuit board. This extraction removes the harmful thermal environment from the electronic components while maintaining their functionality, as the circuit board can be positioned to avoid extreme temperatures even when the load board is subjected to thermal testing conditions.

Inventive Principle:
Principle #2Taking out (Extraction)

2Adaptability or versatility

If custom solutions are created for each application and load board, then the testing can be optimized for specific applications, but the cost and complexity increase significantly

Engineering Contradiction:
Improveapplication-specific testing optimizationVSAvoidcustom circuit creation complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

A universal interface structure is implemented where the circuit board contains standardized connectors that can interface with different load boards from various manufacturers. The circuit board design includes generic signal routing and component mounting patterns that can be adapted to different applications through software configuration rather than requiring custom hardware designs for each application.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Length of moving object

If electronic components are placed on the load board, then the signal paths can be short, but the load board space is limited and signal performance deteriorates due to long paths through the load board

Engineering Contradiction:
Improvesignal path lengthVSAvoidload board space constraints
Core Design Contradiction:
Length of moving objectVSDevice complexity

Solution Approach 1:

The separate circuit board acts as an intermediary between the load board and the electronic components. Instead of routing signals through the load board to reach components mounted on it, the circuit board provides direct access to components through standardized connectors, effectively shortening the signal path while eliminating the need for components to be mounted on the load board itself.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS12467970B2Test arrangement for testing one or more devices, test support module for supporting testing one or more devices, and method for operating an automated test equipment
Publication Date: 2025.11.11 ADVANTEST CORP
  • US12467970B2 patent drawing
  • US12467970B2 patent drawing
  • US12467970B2 patent drawing

AI summary

The disclosure describes a test support module for supporting a test of at least one device under test (DUT). The test support module comprises a plurality of pogo pins configured to establish a connection to at least one of a load board or a probe card of an automated test equipment and at least one electronic support component configured to support a test of at least one DUT. The at least one electronic support component is electrically coupled to the pogo pins. The test support module is configured to be inserted into a pogo block frame of the automated test equipment to position the pogo pins in an alignment position to contact at least one of the load board or the probe card. The testing innovation is more efficient in view of customization, life duration of the components, high signal performance, tester channel resources, re-usability, and costs.