Polar Elastomer Microstructures Patterning for OFETs

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Solution Overview

Problem

The challenge lies in patterning polar elastomer dielectric layers for organic field-effect transistors (OFETs) on non-conductive substrates, which is essential for large-scale integration and applications like OLED displays, as existing methods require conductive substrates and lack spatial control.

Innovation Solution

The method involves using photoresist or metal masks for patterning and etching polar elastomer dielectric layers, allowing for the creation of spatially isolated microstructures and access to conductive contacts, compatible with existing manufacturing infrastructure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If polar elastomer dielectric layers are used to achieve high capacitance for improved transconductance, then the transistor performance is improved, but the ability to pattern and access electrodes is lost when using non-conductive substrates

Engineering Contradiction:
Improvetransistor performanceVSAvoidelectrode access
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent divides the dielectric layer into patterned regions through photolithography and etching processes, creating spatially isolated transistor structures with controlled access to electrodes. The dielectric layer is segmented to form gate dielectrics while maintaining high capacitance in specific regions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different properties to different regions of the dielectric layer. Photoresist masks are applied selectively to create patterned regions with varying dielectric properties, allowing high capacitance regions to be preserved while creating access pathways to electrodes in specific locations.

Inventive Principle:
Principle #3Local quality

2Reliability

If the polar elastomer dielectric layer covers the entire substrate surface to maximize capacitance, then high transconductance is achieved, but spatial isolation of transistor structures and electrode access become impossible

Engineering Contradiction:
ImprovetransconductanceVSAvoidspatial isolation
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies photoresist masks to the dielectric layer before etching, pre-defining the patterns that will create spatially isolated transistor structures. This preliminary patterning action enables precise control over where high capacitance regions are maintained and where access to electrodes is created.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent replaces mechanical shadow masking with photolithography-based patterning. Optical lithography uses light to define patterns through photoresist, providing superior precision and flexibility compared to mechanical shadow masks, enabling accurate spatial isolation while maintaining high capacitance regions.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Ease of operation

If conventional patterning methods are used that require conductive substrates, then electrode access is achieved, but compatibility with non-conductive substrates and large-area integration is lost

Engineering Contradiction:
Improveelectrode accessVSAvoidsubstrate compatibility
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The patent develops a patterning methodology using photolithography and plasma etching that works universally on both conductive and non-conductive substrates. The process uses photoresist masks and chemical etchants that are substrate-agnostic, enabling the same technique to create patterned dielectric layers on various substrate types including flexible polymers and rigid non-conductive materials.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the patterning approach from substrate-dependent mechanical shadow masking to substrate-independent photolithography. By using light-based patterning through photoresist, the process parameters are changed to achieve electrode access on non-conductive substrates while maintaining compatibility with existing semiconductor manufacturing infrastructure.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the fabrication of high-capacity dielectric layers for OFETs, facilitating the integration of polar elastomers into thin film electronics and enabling the production of spatially isolated transistor structures and vias, enhancing transconductance and compatibility with current manufacturing processes.

Implementation Method 1

Polar elastomers can be patterned and etched using photoresist masks and optical lithography

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Implementation Method 2

The polar elastomers can also be patterned and etched using hard masking material such as the patterned metal electrodes

Methodology Applied
Scientific EffectPlasma etching: Plasma

Data Source

PatentUS11329228B2Polar elastomer microstructures and methods for fabricating same
Publication Date: 2022.05.10 CORNING INC
  • US11329228B2 patent drawing
  • US11329228B2 patent drawing
  • US11329228B2 patent drawing

AI summary

A method of fabricating microstructures of polar elastomers includes coating a substrate with a dielectric material including a polar elastomer, coating the dielectric material with a photoresist, exposing the photoresist to ultraviolet (UV) light through a photomask to define a pattern on the photoresist, developing the photoresist to form the pattern on the photoresist, etching the dielectric material to transfer the pattern from the photoresist to the dielectric material, and removing the photoresist from the patterned dielectric material.