Polarization-Selective Overlay Imaging Aligner for Millimeter Wave Antennas

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Solution Overview

Problem

At millimeter wave and terahertz frequencies, mechanical alignment of antenna components becomes increasingly difficult due to sub-millimeter wavelength scales, requiring new techniques for achieving precise positioning that were straightforward at lower frequencies.

Innovation Solution

A compact optical alignment tool using polarization-selective optical elements and imaging optics for real-time simultaneous imaging and alignment of antenna components to sub-wavelength precision, leveraging spatial resolution of digital optical imaging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional mechanical alignment methods are used at millimeter wave frequencies, then alignment simplicity is maintained, but alignment precision deteriorates due to sub-millimeter wavelength scales

Engineering Contradiction:
Improvealignment precisionVSAvoidalignment system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces traditional mechanical alignment methods with an optical imaging system. The alignment tool uses imaging optics to capture images of antenna components and determines alignment status through image processing rather than mechanical measurement, enabling sub-wavelength precision at millimeter wave frequencies.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The alignment tool creates optical images (copies) of the antenna components and their alignment features. By analyzing these image copies rather than directly measuring physical dimensions, the system achieves high precision alignment while maintaining operational simplicity.

Inventive Principle:
Principle #26Copying

2Manufacturing precision

If higher alignment precision is achieved at millimeter wave frequencies, then positioning accuracy improves, but measurement difficulty increases due to sub-millimeter dimensions

Engineering Contradiction:
Improvepositioning accuracyVSAvoidmeasurement difficulty
Core Design Contradiction:
Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent transitions from direct linear measurement in one dimension to optical imaging in multiple dimensions. The imaging system captures spatial information about alignment features from multiple perspectives, making it easier to detect and measure sub-millimeter positioning accuracy without directly measuring the tiny physical dimensions.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The system changes the measurement parameter from direct physical dimension measurement to optical image analysis. By converting the measurement problem into the optical domain, the system can achieve high positioning accuracy while avoiding the difficulties of directly measuring sub-millimeter features.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise alignment of mm-wave antennas to within sub-wavelength accuracy, improving alignment tolerances and position accuracy significantly beyond traditional methods.

Implementation Method 1

a polarization beam splitter configured to receive ambient or active illumination from the first and second antenna components and separate the illumination into two orthogonal polarized states

Methodology Applied
Scientific EffectPolarization: Polarisation

Implementation Method 2

a quarter-wave plate configured to transform a linear polarization state to a circular polarization state

Methodology Applied
Scientific EffectQuarter-wave plate polarization transformation: Polarisation

Implementation Method 3

a retro-reflecting mirror configured to reflect the circularly polarized state back towards the polarization beam splitter

Methodology Applied
Scientific EffectRetro-reflection: Retroreflector

Implementation Method 4

one or more imaging lens and a common detector array, wherein the overlay imaging aligner aligns the two or more antennas by overlaying simultaneous digital images associated with the antennas on the common detector array

Methodology Applied
Scientific EffectOptical imaging: Lens

Implementation Method 5

the detector array generates real-time digital images of the antennas

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS9437923B2Simultaneous imaging and precision alignment of two millimeter wave antennas based on polarization-selective machine vision
Publication Date: 2016.09.06 GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SEC OF COMMERECE THE NAT INST OF STANDARDS & TECH
  • US9437923B2 patent drawing
  • US9437923B2 patent drawing
  • US9437923B2 patent drawing

AI summary

A system and method for imaging and aligning antennas that includes an overlay imaging aligner composed of two or more antennas in association with a polarization gate, a polarization beam splitter, a non-polarizing beam splitter, a beam dump, one or more imaging lens and a common detector array. The overlay imaging aligner aligns the antennas by overlaying simultaneous digital images associated with the antennas on the common detector array. The antennas can be, for example, mm Wave antennas, waveguides, etc. The detector array generates real-time digital images the antennas. Such an approach of simultaneous imaging leverages the spatial resolution of digital optical imaging to aligning antenna components.