Polarized Microscope Kerr Rotation Correction Across the Image Field

The patent applies local quality by measuring and correcting polarization characteristics for each region of interest (ROI) within the intra image field. Instead of using a single uniform correction, the system calculates device integers and performs corrections individually for each ROI, accounting for local variations in polarization characteristics across the image field.

The patent implements feedback by measuring the actual polarization characteristics at multiple angles, comparing them with expected values, and using the differences to calculate correction values. The system obtains hysteresis loops at different angles, processes them to extract polarization information, and uses this feedback to correct measurements and improve quantification accuracy.

The patent applies segmentation by dividing the intra image field into multiple regions of interest (ROIs) and processing each region independently. The system obtains hysteresis loops for each ROI at different angles and processes them separately, which allows for localized correction while managing computational complexity through modular processing.

The patent utilizes parameter changes by obtaining hysteresis loops at multiple different angles (e.g., first angle and second angle) and processing the images at these different angular parameters. This allows the system to extract polarization characteristic information and calculate correction values by analyzing how the hysteresis loops change with angle, enabling precise correction while maintaining manageable processing complexity through systematic parameter variation.