Non-Destructive Particle Sizing with Polarized Speckle Analysis
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Solution Overview
Problem
Current imaging techniques are not well suited for estimating the size distribution of scattering particles within turbid materials, such as tissue, in a non-invasive manner, particularly for live biological tissues or biomaterials in their native states.
Innovation Solution
A method and apparatus using non-ionizing light rays to transmit polarized light to a sample, analyze speckle decorrelation rates at parallel and perpendicular polarized components, and estimate the average size of scattering particles without contacting or manipulating the specimen, employing a processor to determine speckle intensity autocorrelation curves and viscoelastic moduli.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If destructive techniques such as electron microscopy are used to assess particle size, then measurement precision is improved, but the specimen is damaged and cannot be used for further analysis
Solution Approach 1:
The patent replaces destructive mechanical/electron microscopy techniques with non-ionizing optical techniques. Specifically, it uses laser illumination to generate speckle patterns and analyzes temporal fluctuations in these patterns to determine particle size, eliminating the need for physical sectioning or electron beam exposure that damages specimens.
Solution Approach 2:
The patent changes the measurement parameter from direct spatial imaging (microscopy) to temporal analysis of optical fluctuations. By measuring the time-dependent speckle decorrelation and relating it to particle dynamics, the system extracts size information without physical contact or damage to the specimen.
2Object-affected harmful factors
If conventional optical approaches are used to estimate size distribution, then non-invasive measurement is achieved, but the technique is limited to extremely dilute liquid samples only
Solution Approach 1:
The patent introduces speckle patterns as an intermediary that mediates between the incident light and the scattering particles. The temporal fluctuations of these speckle patterns provide information about particle dynamics in concentrated samples, enabling non-invasive measurement in both liquid and solid specimens regardless of concentration.
3Measurement precision
If polarized light analysis is performed to determine speckle decorrelation rates, then particle size estimation accuracy is improved, but device complexity increases
Solution Approach 1:
The patent uses the specimen's own scattering properties to generate the measurement signal. The scattered light naturally exhibits polarization characteristics that encode particle size information, eliminating the need for external labels, contrast agents, or complex manipulation apparatus. The system simply detects the intrinsic optical properties of the specimen.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables non-destructive estimation of scattering particle sizes and spatial mapping of viscoelastic properties in tissues, providing insights into tissue heterogeneity and potential diagnostic implications, applicable for clinical diagnosis and treatment monitoring.
Implementation Method 1
transmitting, using a coherent light source, polarized light to the sample
Implementation Method 2
obtaining, using a detector, polarized light reflected from the sample, the polarized light comprising a parallel polarized component and a perpendicular polarized component
Implementation Method 3
determining, using a processor, speckle decorrelation rates for the parallel polarized component and the perpendicular polarized component
Data Source
AI summary
A method for non-destructively estimating an average size of scattering particles in a sample, including: transmitting, using a coherent light source, polarized light to the sample; obtaining, using a detector, polarized light reflected from the sample, the polarized light comprising a parallel polarized component and a perpendicular polarized component; determining, using a processor, speckle decorrelation rates for the parallel polarized component and the perpendicular polarized component; and estimating, using the processor, the average size of scattering particles in the sample based on the speckle decorrelation rates for the parallel polarized component and the perpendicular polarized component.


