Polarizer Optical Parameter Measurement via Layer Segmentation

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Solution Overview

Problem

Current methods cannot accurately measure the impact of individual layers in a polarizer on the dark state brightness and polarization degree of liquid crystal display (LCD) panels, making it difficult to enhance the contrast and polarization performance.

Innovation Solution

A method and device for measuring optical parameters of a polarizer, which involves passing linearly polarized light through both the compensation film and the PVA layer in different states to acquire specific measurement parameters, allowing for the determination of the effects of each layer on dark state brightness and polarization degree.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the polarizer is measured as a whole, then the measurement process is simple, but it is impossible to sort out which layer affects the dark state performance

Engineering Contradiction:
Improvelayer-specific optical parameter measurementVSAvoidmeasurement process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The measurement process is segmented into two distinct states: one where light passes through the compensation film first then the PVA layer, and another where light passes through the PVA layer first then the compensation film. By measuring the polarizer in these separated states and comparing the results, the contribution of each layer to dark state performance can be independently determined.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The measurement method uses the incident linearly polarized light as an intermediary to probe the optical properties of different layers. By controlling the sequence in which light interacts with the compensation film and PVA layer, the method enables indirect measurement of each layer's specific contribution to the overall polarizer performance.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Illumination intensity

If the dark state brightness is reduced to improve contrast, then the polarization degree must be increased, but it is difficult to determine which layer to optimize

Engineering Contradiction:
Improvedark state brightnessVSAvoidlayer impact analysis
Core Design Contradiction:
Illumination intensityVSMeasurement precision

Solution Approach 1:

The method segments the optical path into two measurement configurations: one measuring the combined effect of compensation film and PVA layer, and another measuring the reverse sequence. By comparing the dark state brightness values from these segmented measurements, the specific impact of each layer on dark state performance can be isolated and quantified.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The measurement approach changes the parameter of light propagation sequence through the polarizer layers. By reversing the order in which light passes through the compensation film and PVA layer, the method creates different measurement conditions that reveal the individual contribution of each layer to dark state brightness and polarization degree.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables targeted improvement of the polarizer's optical performance by measuring the influence of the compensation film and PVA layer on brightness, contrast, and polarization degree, resulting in enhanced contrast and polarization performance.

Implementation Method 1

providing an incident linearly polarized light sequentially to pass through the compensation film and the PVA layer

Methodology Applied
Scientific EffectPolarization: Polarisation

Implementation Method 2

The polarizer absorbs light in a direction perpendicular to the polarization axis and transmits only the light in the polarization axis direction

Methodology Applied
Scientific EffectAbsorption: Absorption (EM radiation)

Data Source

PatentUS10746628B2Method of measuring optical parameters of polarizer and measuring device
Publication Date: 2020.08.18 HUIZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD
  • US10746628B2 patent drawing
  • US10746628B2 patent drawing
  • US10746628B2 patent drawing

AI summary

The disclosure discloses a method of measuring optical parameters of a polarizer and a measuring device. The polarizer includes a compensation film and a PVA layer. The measuring method includes the following steps. In the first state, providing an incident linearly polarized light sequentially to pass through the compensation film and the PVA layer, acquiring a first measurement parameter and a second measurement parameter when the brightness of the light emitted from the polarizer is lowest and is highest. In the second state, providing the incident linearly polarized light sequentially to pass through the PVA layer and the compensation film, acquiring a third measurement parameter and a fourth measurement parameter when the brightness of the light emitted from the polarizer is lowest and is highest; and acquiring optical parameters of the compensation film and/or the PVA layer in the polarizer according to one or more of the above measurement parameters.