Polarizer Transmittance Measurement Correction for Backlight Fluctuation

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Solution Overview

Problem

Current transmittance measuring methods for polarizers are significantly influenced by factors like backlight brightness fluctuations and alignment deviations, leading to large measurement errors and poor accuracy.

Innovation Solution

A transmittance measuring method that involves acquiring an initial transmittance and a correction value for each measuring point, which are then used to determine the accurate transmittance of optical films, reducing errors caused by backlight fluctuations and alignment deviations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If successive attachment of test samples is used to measure transmittance, then measurement comparison can be performed, but measurement accuracy deteriorates due to backlight brightness fluctuation and alignment deviation

Engineering Contradiction:
Improvetransmittance measurement accuracyVSAvoidmeasurement stability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent measures and stores transmittance values of reference optical films at multiple positions before actual measurement. These pre-measured reference values are then used to correct and compensate for variations during subsequent sample measurements, eliminating the need for repeated manual positioning and attachment operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements a correction mechanism where measured transmittance values are compared against reference values, and correction values are calculated and applied to compensate for deviations caused by backlight fluctuation and alignment variation, creating a feedback loop that continuously improves measurement accuracy.

Inventive Principle:
Principle #23Feedback

2Productivity

If manual change of OC is performed to measure different polarizer samples, then sample comparison is enabled, but time consumption increases and measurement accuracy decreases

Engineering Contradiction:
Improvemeasurement efficiencyVSAvoidtransmittance measurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent pre-measures and stores transmittance values of reference optical films at multiple positions before actual measurement. These pre-measured reference values are then used to correct and compensate for variations during subsequent sample measurements, eliminating the need for repeated manual positioning and attachment operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent creates a digital copy of reference measurement data that can be repeatedly used for correction calculations without physical repositioning. The reference transmittance values are stored and reused across multiple sample measurements, replacing the need for manual physical operations with computational correction.

Inventive Principle:
Principle #26Copying

3Measurement precision

If multiple measuring points are used to capture transmittance variations, then measurement comprehensiveness improves, but measurement complexity and time consumption increase

Engineering Contradiction:
Improvetransmittance measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent measures and stores transmittance values of reference optical films at multiple positions before actual measurement. These pre-measured reference values are then used to correct and compensate for variations during subsequent sample measurements, eliminating the need for repeated manual positioning and attachment operations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent systematically varies the measurement position parameter across multiple points to capture spatial transmittance variations, then uses computational correction based on reference values at each position to standardize results, transforming a complex multi-point physical measurement into a manageable parameter-based correction process.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10859494B2Transmittance measuring method, device and computer readable storage medium
Publication Date: 2020.12.08 CHONGQING HKC OPTOELECTRONICS TECH CO LTD
  • US10859494B2 patent drawing
  • US10859494B2 patent drawing
  • US10859494B2 patent drawing

AI summary

Disclosed are a transmittance measuring method, which includes the following operations: acquiring the initial transmittance of a polarizer to be measured at a measuring point; acquiring a transmittance correction value corresponding to the measuring point; determining the transmittance of the polarizer to be measured according to the initial transmittance and the transmittance correction value corresponding to the measuring point.