Wafer Polishing Head Epoxy Coating Adhesive Contamination

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The existing wafer polishing process is contaminated by an adhesive layer from the rubber chuck and template assembly, leading to deterioration of wafer flatness due to the adhesive eluting into the slurry during polishing.

Innovation Solution

A wafer polishing head with a template assembly featuring a base substrate, guide ring, and adhesive material, where a second epoxy coating layer is applied to cover the adhesive, preventing it from entering the slurry, and a manufacturing method involving multiple drying stages to form the coating layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If adhesive material is used to attach the guide ring to the base substrate, then the guide ring can be securely fixed, but the adhesive may elute into the slurry and contaminate the wafer

Engineering Contradiction:
Improveadhesive bonding strengthVSAvoidadhesive contamination
Core Design Contradiction:
StrengthVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an epoxy coating layer as an intermediary substance between the adhesive material and the external environment. This coating layer acts as a barrier that prevents the adhesive from eluting into the slurry while allowing the adhesive to maintain its bonding function. The epoxy coating is applied over the adhesive material and serves as a protective interface that eliminates harmful interactions between the adhesive and the polishing slurry.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies a thin epoxy coating layer over the adhesive material. This thin film serves as a protective barrier that prevents adhesive elution into the slurry. The coating is thin enough to not interfere with the bonding strength but thick enough to provide effective contamination prevention. This flexible protective film approach allows the system to maintain both strong adhesion and contamination resistance.

Inventive Principle:
Principle #30Flexible shells and thin films

2Object-affected harmful factors

If multiple coating layers are applied to cover the adhesive, then adhesive elution is prevented, but the manufacturing process becomes more complex

Engineering Contradiction:
Improveadhesive contaminationVSAvoidcoating process complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent applies epoxy coating not only where absolutely necessary but as a comprehensive protective layer covering all adhesive surfaces that could potentially contact slurry. This excessive application approach ensures complete contamination prevention without requiring complex selective coating patterns. The simplified coating strategy of applying epoxy broadly rather than precisely selectively reduces manufacturing complexity while maintaining effective protection.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The patent changes the physical and chemical parameters of the coating material by using epoxy resin with specific properties (viscosity, curing characteristics, adhesion strength). By selecting epoxy with appropriate parameters, the coating can be applied in a relatively simple process while achieving effective contamination prevention. The parameter optimization of the epoxy material allows for easier application and curing processes.

Inventive Principle:
Principle #35Parameter changes

3Ease of manufacture

If the adhesive layer is exposed, then the application process is simpler, but the wafer flatness deteriorates due to adhesive elution into slurry

Engineering Contradiction:
Improveassembly simplicityVSAvoidwafer flatness
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent performs the epoxy coating application as a preliminary step before the polishing process begins. By pre-applying and curing the epoxy coating over the adhesive material before assembly, the system ensures that the adhesive is already protected when the polishing process starts. This preliminary protective action prevents any possibility of adhesive elution during polishing while maintaining relatively simple manufacturing procedures.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents adhesive contamination during polishing, thereby improving the flatness of the wafer by ensuring the adhesive layer does not elute into the slurry.

Implementation Method 1

a second coating layer formed on an outer circumferential surface of the adhesive material and an outer circumferential surface of the guide ring

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 2

multiple drying stages to form the coating layers

Methodology Applied
Scientific EffectEvaporation: Evaporation

Data Source

PatentUS12134162B2Wafer polishing head, method for manufacturing wafer polishing head, and wafer polishing apparatus comprising same
Publication Date: 2024.11.05 SK SILTRON CO LTD
  • US12134162B2 patent drawing
  • US12134162B2 patent drawing
  • US12134162B2 patent drawing

AI summary

The present invention provides a method for manufacturing a wafer polishing head, the method comprising the steps of: coupling a guide ring consisting of a plurality of layers to the edge of a base substrate; rounding the edge of the guide ring; forming a first coating layer on the rounded surface of the guide ring through coating; fixing a rubber chuck to the base substrate; and forming a second coating layer on the outer circumferential surfaces of an adhesive and an adhesive material through coating, from the rubber chuck to the first coating layer.