Polishing Pad with Controlled Air Bubble Diameter Variation

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Solution Overview

Problem

Existing polishing pads struggle to simultaneously achieve both high flatness and surface finish quality in semiconductor wafer polishing, often resulting in scratches or deterioration of flatness due to non-uniform contact and varying air bubble diameters.

Innovation Solution

A polishing pad with a density range of 0.36 to 0.70 g/cm3 and spherical air bubbles with controlled diameter variations, ensuring uniform contact and reduced scratch occurrence, is developed using polyurethane resin foam with adjusted Shore A hardness and air bubble connectivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a hard polishing pad is used to finish the object flat, then flatness is improved, but surface finish deteriorates due to increased scratches

Engineering Contradiction:
ImproveflatnessVSAvoidsurface scratches
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The polishing pad employs a dual-layer structure where the lower layer (first polishing layer) has higher hardness for flatness, while the upper layer (second polishing layer) has lower hardness and different air bubble characteristics for surface finish. This local differentiation allows each layer to perform its specific function optimally without compromising the other.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The polishing pad is constructed as a composite of two distinct polyurethane resin foam layers with different density ratios, air bubble characteristics, and hardness levels. This composite structure combines the flatness-enhancing properties of hard foam with the surface-finish-enhancing properties of soft foam, resolving the contradiction between flatness and scratch prevention.

Inventive Principle:
Principle #40Composite materials

2Object-affected harmful factors

If multi-step polishing is performed to improve surface quality, then surface finish improves, but flatness deteriorates due to trade-off between steps

Engineering Contradiction:
Improvesurface qualityVSAvoidflatness
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The invention merges the functions of multiple polishing steps into a single polishing pad by stacking two layers with complementary characteristics. The first layer addresses flatness while the second layer addresses surface quality, allowing both functions to be performed simultaneously in one step rather than requiring separate sequential steps that trade off against each other.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The polishing pad is segmented into two functional layers: the first polishing layer optimized for flatness with higher density ratio and different air bubble characteristics, and the second polishing layer optimized for surface quality with lower density ratio and controlled air bubble diameter variation. This segmentation allows independent optimization of each function within a unified structure.

Inventive Principle:
Principle #1Segmentation

3Ease of operation

If air bubble-based openings are formed on the polishing pad surface, then polishing function is enabled, but non-uniform contact and scratching occur due to irregular air bubble arrangement

Engineering Contradiction:
Improvepolishing functionVSAvoidcontact uniformity
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The invention changes the critical parameter of air bubble diameter variation from the conventional large range (1 μm to 5 mm, average 10 μm to 200 μm) to a tightly controlled small range (average 10 μm to 200 μm with standard deviation of 30 μm or less). This parameter control creates more uniform air bubble openings that enable polishing function while reducing contact non-uniformity and scratching.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20240157505A1Polishing pad
Publication Date: 2024.05.16 UNIVERSAL PHOTONICS FAR EAST INC
  • US20240157505A1 patent drawing
  • US20240157505A1 patent drawing
  • US20240157505A1 patent drawing

AI summary

A polishing pad is formed from a foam body comprising substantially spherical air bubbles. When the density of a pad constituent material is denoted by DM g/cm3, the density of the polishing pad is in the range of 0.36 to 0.70 DM, the variation (standard deviation σ1) of an opening part diameter based on the air bubbles and formed in the surface of the polishing pad is adjusted to 45 μm or less, when the area of a portion surrounded by opening parts based on the air bubbles formed in the surface of the polishing pad is approximated to a circle, the variation (standard deviation σ2) of a diameter of the circle, is adjusted to 35 μm or less, and the air bubbles included in the foam body may be closed cell or open cell.