Shared Poly Gate Tie-Off Layout for FinFET Isolation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In the development of vertical semiconductor devices like FinFETs, the increasing density of integrated circuits leads to electromagnetic interference between adjacent devices, and existing isolation methods are inefficient in maintaining device isolation without occupying additional device area.

Innovation Solution

Positioning a poly gate at the threshold voltage boundary and directly connecting it to a power rail using a conductive via to maintain the tie-off transistor in an off state, thereby electrically isolating adjacent transistors and optimizing device layout by eliminating the need for separate tie-off devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If separate tie-off devices are used for electrical isolation, then device isolation is achieved, but device area is increased

Engineering Contradiction:
Improvedevice isolationVSAvoiddevice area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent combines the isolation function with the poly gate structure by positioning the poly gate at the threshold voltage boundary and connecting it to a power rail. This merging eliminates the need for separate tie-off devices, achieving electrical isolation while reducing device area occupation.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The poly gate structure is given dual functionality: it serves as both the gate for the transistor and the isolation device (tie-off device). By connecting the poly gate to the power rail via a conductive via, the same structure performs both switching and isolation functions, optimizing space utilization.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If device density is increased, then productivity is improved, but electromagnetic interference increases

Engineering Contradiction:
Improvedevice densityVSAvoidelectromagnetic interference
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent extracts the harmful electromagnetic interference by introducing isolation regions between adjacent devices. The poly gate positioned at the threshold voltage boundary acts as an isolation barrier, separating adjacent high-density devices and preventing electromagnetic interference while maintaining high device density.

Inventive Principle:
Principle #2Taking out (Extraction)

3Reliability

If poly gate is connected to power rail, then tie-off transistor remains in off state, but additional manufacturing steps are required

Engineering Contradiction:
Improveisolation stateVSAvoidmanufacturing complexity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent performs the isolation configuration during the existing poly gate formation process. The poly gate is positioned at the threshold voltage boundary and connected to the power rail through a conductive via as part of the standard fabrication sequence, ensuring the tie-off transistor is pre-configured in the off state before device operation.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20240387547A1Tie off device
Publication Date: 2024.11.21 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240387547A1 patent drawing
  • US20240387547A1 patent drawing
  • US20240387547A1 patent drawing

AI summary

An integrated circuit device includes a first power rail, a first active area extending in a first direction, and a plurality of gates contacting the first active area and extending in a second direction perpendicular to the first direction. A first transistor includes the first active area and a first one of the gates. The first transistor has a first threshold voltage (VT). A second transistor includes the first active area and a second one of the gates. The second transistor has a second VT different than the first VT. A tie-off transistor is positioned between the first transistor and the second transistor, and includes the first active area and a third one of the gates, wherein the third gate is connected to the first power rail.